Electron Probe Microanalysis

Content: 
Advances in Electronics and Electron Physics, Page ii
Front Matter, Page iii
Copyright, Page iv
List of Contributors, Page v
Foreword, Page vii, A.J. TOUSIMIS, L. MARTON
Survey of Microanalysis—Interpolation and Extrapolation, Pages 1-14, L. MARTON
Behavior of Electrons in a Specimen, Pages 15-43, GUNJI SHINODA
The Sandwich Sample Technique Applied to Quantitative Microprobe Analysis, Pages 45-71, JAMES D. BROWN
Quantitative Microprobe Analysis: A Basis for Universal Atomic Number Correction Tables, Pages 73-115, RICHARD C. WOLF, VICTOR G. MACRES
Deconvolution: A Technique to Increase Electron Probe Resolution, Pages 117-136, E.J. RAPPERPORT
Analysis for Low Atomic Number Elements with the Electron Microprobe, Pages 137-153, P.S. ONG
Changes in X-Ray Emission Spectra Observed between the Pure Elements and Elements in Combination with Others to Form Compounds or Alloys, Pages 155-176, WILLIAM L. BAUN
Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis, Pages 177-196, J.W. COLBY
The Influence of the Preparation of Metal Specimens on the Precision of Electron Probe Microanalysis, Pages 197-225, G. HALLERMAN, M.L. PICKLESIMER
Electron Probe Microanalysis in Mineralogy, Pages 227-244, CYNTHIA W. MEAD
Electron Probe Analysis in Metallurgy, Pages 245-290, JOSEPH I. GOLDSTEIN
Scanning Electron Probe Measurement of Magnetic Fields, Pages 291-312, JOHN R. DORSEY
Nondispersive X-Ray Emission Analysis for Lunar Surface Geochemical Exploration, Pages 313-360, J.I. TROMBKA, I. ADLER
The Divergent Beam X-Ray Technique, Pages 361-431, HARVEY YAKOWITZ
Author Index, Pages 433-440
Subject Index, Pages 441-450