Modern diffraction methods

Content: 
Chapter 1 Structure Determination of Single Crystals (pages 1–26): Sander van Smaalen
Chapter 2 Modern Rietveld Refinement, a Practical Guide (pages 27–60): Robert Dinnebier and Melanie Muller
Chapter 3 Structure of Nanoparticles from Total Scattering (pages 61–86): Katharine L. Page, Thomas Proffen and Reinhard B. Neder
Chapter 4 Diffraction Line?Profile Analysis (pages 87–126): Prof. Dr. Eric J. Mittemeijer and Dr. Udo Welzel
Chapter 5 Residual Stress Analysis by X?Ray Diffraction Methods (pages 127–154): Christoph Genzel, Ingwer A. Denks and Manuela Klaus
Chapter 6 Stress Analysis by Neutron Diffraction (pages 155–171): Lothar Pintschovius and Michael Hofmann
Chapter 7 Texture Analysis by Advanced Diffraction Methods (pages 173–220): Hans?Rudolf Wenk
Chapter 8 Surface?Sensitive X?Ray Diffraction Methods (pages 221–257): Andreas Stierle and Elias Vlieg
Chapter 9 The Micro? and Nanostructure of Imperfect Oxide Epitaxial Films (pages 259–282): Alexandre Boulle, Florine Conchon and Rene Guinebretiere
Chapter 10 Quantitative Phase Analysis Using the Rietveld Method (pages 283–320): Ian C. Madsen, Nicola V. Y. Scarlett, Daniel P. Riley and Mark D. Raven
Chapter 11 Kinetics of Phase Transformations and of Other Time?Dependent Processes in Solids Analyzed by Powder Diffraction (pages 321–358): Andreas Leineweber and Prof. Dr. Eric J. Mittemeijer
Chapter 12 Laboratory Instrumentation for X?Ray Powder Diffraction: Developments and Examples (pages 359–398): Dr. Udo Welzel and Prof. Dr. Eric J. Mittemeijer
Chapter 13 The Calibration of Laboratory X?Ray Diffraction Equipment Using NIST Standard Reference Materials (pages 399–438): James P. Cline, David Black, Donald Windover and Albert Henins
Chapter 14 Synchrotron Diffraction: Capabilities, Instrumentation, and Examples (pages 439–468): Gene E. Ice
Chapter 15 High?Energy Electron Diffraction: Capabilities, Instrumentation, and Examples (pages 469–489): Christoph T. Koch
Chapter 16 In Situ Diffraction Measurements: Challenges, Instrumentation, and Examples (pages 491–517): Helmut Ehrenberg, Anatoliy Senyshyn, Manuel Hinterstein and Hartmut Fuess