Bias Temperature Instability for Devices and Circuits

Front Matter....Pages i-xi
Front Matter....Pages 1-1
Bias Temperature Instability Characterization Methods....Pages 3-31
Application of On-Chip Device Heating for BTI Investigations....Pages 33-51
Statistical Characterization of BTI-Induced High-k Dielectric Traps in Nanoscale Transistors....Pages 53-74
The Time-Dependent Defect Spectroscopy....Pages 75-109
Analysis of Oxide Traps in Nanoscale MOSFETs using Random Telegraph Noise....Pages 111-134
BTI-Induced Statistical Variations....Pages 135-160
Statistical Distribution of Defect Parameters....Pages 161-176
Atomic-Scale Defects Associated with the Negative Bias Temperature Instability....Pages 177-228
Charge Properties of Paramagnetic Defects in Semiconductor/Oxide Structures....Pages 229-252
Oxide Defects....Pages 253-285
Understanding Negative-Bias Temperature Instability from Dynamic Stress Experiments....Pages 287-302
Front Matter....Pages 303-303
Atomistic Modeling of Defects Implicated in the Bias Temperature Instability....Pages 305-321
Statistical Study of Bias Temperature Instabilities by Means of 3D “Atomistic” Simulation....Pages 323-348
A Comprehensive Modeling Framework for DC and AC NBTI....Pages 349-378
On the Microscopic Limit of the RD Model....Pages 379-408
Advanced Modeling of Oxide Defects....Pages 409-446
The Capture/Emission Time Map Approach to the Bias Temperature Instability....Pages 447-481
Front Matter....Pages 483-483
Impact of Hydrogen on the Bias Temperature Instability....Pages 485-505
FEOL and BEOL Process Dependence of NBTI....Pages 507-532
Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors....Pages 533-559
Front Matter....Pages 483-483
NBTI and PBTI in HKMG....Pages 561-584
PBTI in High-k Oxides....Pages 585-596
Characterization of Individual Traps in High-κ Oxides....Pages 597-614
NBTI in (Si)Ge Channel Devices....Pages 615-641
Characteristics of NBTI in Multi-gate FETs for Highly Scaled CMOS Technology....Pages 643-659
Bias-Temperature Instabilities in Silicon Carbide MOS Devices....Pages 661-675
Front Matter....Pages 677-677
On-Chip Silicon Odometers for Circuit Aging Characterization....Pages 679-717
Multilevel Reliability Simulation for IC Design....Pages 719-749
Charge Trapping in MOSFETS: BTI and RTN Modeling for Circuits....Pages 751-782
Simulation of BTI-Related Time-Dependent Variability in CMOS Circuits....Pages 783-810