Advances in X-Ray Analysis: Volume 31

Content: 
Front Matter....Pages i-xvii
Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research)....Pages 1-7
Microstructural and Chemical Analysis using Electron Beams: The Analytical Electron Microscope....Pages 9-24
X-ray Imaging of Surface and Internal Structure....Pages 25-34
X-ray Imaging: Status and Trends....Pages 35-52
Secondary Ion Mass Spectrometry and Related Techniques....Pages 53-58
X-ray Microscopy using Collimated and Focussed Synchrotron Radiation....Pages 59-68
Imaging with Spectroscopic Data....Pages 69-75
Small Area X-ray Diffraction Techniques; Errors in Strain Measurement....Pages 77-85
Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys....Pages 87-92
An Automated X-ray Microfluorescence Materials Analysis System....Pages 93-98
Industrial Applications of X-ray Computed Tomography....Pages 99-105
Correlations between X-ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films....Pages 107-112
Defect Structure of Synthetic Diamond and Related Phases....Pages 113-128
Microstructural Characterization of Thin Polycrystalline Films by X-ray Diffraction....Pages 129-142
Automated X-ray Topography and Rocking Curve Analysis: A Realiability Study....Pages 143-154
Grazing Incidence X-ray Scattering Studies of Single Quantum Wells....Pages 155-160
Dynamical Theory of Asymmetric X-ray Diffraction for Strained Crystal Wafers....Pages 161-165
Dynamical X-ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers....Pages 167-173
Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters....Pages 175-180
The ?-Integral Method for X-ray Residual Stress Measurements....Pages 181-190
Oscillations in Interplanar Spacing vs. Sin2? a Fem Analysis....Pages 191-204
Focusing Circle Errors in X-ray Residual Stress Measurements of Nickel-Based Materials....Pages 205-212
Residual Stress Analysis in Steels Having Preferred Orientation by use of Synchrotron Radiation Source....Pages 213-222
Macro and Micro-Stress Distributions in Filled Epoxy Systems....Pages 223-230
Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-ray Diffraction....Pages 231-243
A Comparison of Diffraction Elastic Constants of Steel Measured with X-rays and Neutrons....Pages 245-253
Residual Stress in Two Dental Alloys During Porcelain Application....Pages 255-260
Pre-Cracking Technique and its Application to X-ray Fractography of Alumina Ceramics....Pages 261-268
X-ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential....Pages 269-276
A New Method for Evaluating X-ray Diffraction Peak Broadening with Engineering Applications....Pages 277-286
X-ray Line Broadening Study on Shock-Modified Hematite....Pages 287-294
Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-ray Powder Diffraction....Pages 295-308
Preliminary Results from a Powder Diffraction Data Intensity Round-Robin....Pages 309-315
The Estimation of Limits of Detection in RIM Quantitative X-ray Diffraction Analysis....Pages 317-323
Automated Quantitative Multiphase Analysis using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector....Pages 325-330
X-ray Diffraction Analysis of Fly Ash....Pages 331-342
Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes....Pages 343-349
High Temperature Stability of Superconducting YBa2CU3Ox as Characterized by X-ray Diffraction....Pages 351-357
X-Ray Study of the BaO-Y2O3-CuOx System....Pages 359-370
Comparison of calculated and experimental powder X-ray Diffraction patterns of organic materials....Pages 371-376
Neutron Diffraction — A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium....Pages 377-384
Applications of Pulsed Neutron Powder Diffraction to Actinide Elements....Pages 385-393
Asymmetric Crystals Re-Visited....Pages 395-401
A 4 Crystal Monochromator for High Resolution Rocking Curves....Pages 403-408
Laser Aligned Laue Technique for Small Crystals....Pages 409-411
A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations....Pages 413-421
Using Digitized X-ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program....Pages 423-430
PC Based Topography Technique....Pages 431-438
X-ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector....Pages 439-444
X-ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters....Pages 445-448
Advances and Enhancements in Light Element EDXRF....Pages 449-454
Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries....Pages 455-459
A New Analysis Principle for EDXRF: The Monte Carlo - Library Least-Squares Analysis Principle....Pages 461-469
Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry....Pages 471-478
Appearance Potential X-ray Fluorescence Analysis....Pages 479-486
Near-Surface Analysis of Semiconductor Using Grazing Incidence X-ray Fluorescence....Pages 487-494
A Scanning X-ray Fluorescence Microprobe with Synchrotron Radiation....Pages 495-502
Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries....Pages 503-506
Intensity and Distribution of Background X-rays in Wavelength Dispersive Spectrometry....Pages 507-514
Back Matter....Pages 515-523