Advances in X-Ray Analysis: Volume 34

Content: 
Front Matter....Pages i-xxi
Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis....Pages 1-12
Glancing Angle X-Ray Absorption Spectroscopy....Pages 13-22
Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis....Pages 23-33
Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids....Pages 35-40
Trace Element Analysis of Solutions at the PPB Level....Pages 41-55
Trace Analysis Using EDS: Applications to Thin-Film and Heterogeneous Samples....Pages 57-70
Grazing Incidence X-Ray Fluorescence Analysis with Monochromatic Radiation....Pages 71-80
Impurity Analysis on Si Wafer Using Monochro-Trex....Pages 81-89
Chemical State Analysis by Soft X-Ray Emission Spectra with Molecular-Orbital Calculations....Pages 91-103
Fundamentals of X-Ray Spectrometric Analysis using Low-Energy Electron Excitation....Pages 105-121
Chemical Bonding Studies of Solutions by High Resolution X-Ray Fluorescence Spectroscopy....Pages 123-130
Advances in Boron Measurement with Wavelength Dispersive XRF....Pages 131-137
Soft and Ultra-Soft X-Ray Spectrometry using Long-Wavelength Dispersive Devices....Pages 139-148
Requirement Analysis and Preliminary Design for Energy Dispersive X-Ray Fluorescence Analysis Software....Pages 149-156
Quantitative XRF Analysis using the Fundamental Algorithm....Pages 157-162
Practical Application for the use of Statistics to Establish Quality Control and Implement Quality Assurance in X-Ray Fluorescence....Pages 163-167
Drift in Energy Calibration of Energy Dispersive X-Ray Fluorescence Analyzers and its Correction....Pages 169-176
Current and Future Energy Dispersive Exafs Detector Systems....Pages 177-185
High Throughput Rate Solid State Detector Systems for Fluorescence Exafs....Pages 187-191
A Review of the Relative Merits of Low Powered WDXRF and EDXRF Spectrometers for Routine Quantitative Analysis....Pages 193-199
Imaging XPS. A Contribution to 3D X-Ray Analysis....Pages 201-211
Graphite Fusion of Geological Samples....Pages 213-216
Fast, High-Resolution X-Ray Microfluorescence Imaging....Pages 217-221
High-Temperature Displacement Measurement Using a Scanning Focussed X-Ray Line Source....Pages 223-230
On-Belt Determination of Calcium Concentration by X-Ray Fluorescence....Pages 231-237
Niobium Concentration Measurement in Steel Samples with TXRF....Pages 239-241
Mass Absorption Coefficient Determination Using Compton Scattered Tube Radiation: Applications, Limitations and Pitfalls....Pages 243-261
Trace Element Analysis of Rocks by X-Ray Spectrometry....Pages 263-276
X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements....Pages 277-283
X-Ray Fluorescence Analysis of High-Density Brines Using a Compton Scattering Ratio Technique....Pages 285-292
Secondary Target X-Ray Excitation for in Vivo Measurement of Lead in Bone....Pages 293-298
Phosphorus Determination in Borophosphosilicate or Phosphosiligate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy....Pages 299-305
Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies....Pages 307-312
X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry....Pages 313-318
X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses....Pages 319-324
Measurement of Mass Absorption Coefficients Using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis....Pages 325-335
Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with an Integrated Readout Chip....Pages 337-347
Practical and “Unusual” Applications in X-Ray Diffraction Using Position Sensitive Detectors....Pages 349-355
CCD Based X-Ray Detectors....Pages 357-362
Wide Angle and Small Angle X-Ray Scattering Applications Using a Two-Dimensional Area Detector....Pages 363-368
Evaluation of Reference X-Ray Diffraction Patterns in the ICDD Powder Diffraction File....Pages 369-376
MATCHDB — A Program for the Identification of Phases Using a Digitized Diffraction-Pattern Database....Pages 377-385
X-Ray Diffraction Analysis of Fly Ash. II. Results....Pages 387-394
Development of a Calibration Method for Quantitative X-Ray Powder Diffraction of Size-Segregated Aerosols....Pages 395-407
Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios....Pages 409-415
Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry....Pages 417-427
Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products....Pages 429-435
A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell....Pages 437-446
Phase Analysis of Metallic Plutonium-Containing Fuel Alloys Using Neutron Diffraction....Pages 447-457
High-Temperature XRD Analysis of Polymers....Pages 459-463
Residual Strains in Al2O3/ SiC (Whisker) Composite from 25-1000°C....Pages 465-471
Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone....Pages 473-482
The Substructure of Austenite and Martensite through a Carburized Surface....Pages 483-491
Determination of Lattice Parameter and Strain of ?’ Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry....Pages 493-499
The Effect of Satellite Lines from the X-Ray Source on X-Ray Diffraction Peaks....Pages 501-506
X-Ray Topography and TEM Study of Crystal Defect Propagation in Epitaxially Grown AlGaAs Layers on GaAs(001)....Pages 507-517
Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers....Pages 519-529
Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed GaAs....Pages 531-541
X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition....Pages 543-555
Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films....Pages 557-565
The Thickness Measurements of Thin Bulk Film By X-Ray Method....Pages 567-575
Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement....Pages 577-586
Thermal Stress Relaxation in Vapor Deposited Thin Films....Pages 587-600
An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data....Pages 601-610
Residual Stresses in Railroad Car Wheels....Pages 611-622
Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels....Pages 623-631
Use of X-Ray Diffraction Using Gaussian Curve Method for Measuring Plastic Strain of Steels....Pages 633-642
X-Ray Elastic Constants for ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC(Whisker) Composite....Pages 643-650
X-Ray Study On Fatigue Fracture Surfaces of Aluminium Alloy Reinforced With Silicon Carbide Whiskers....Pages 651-659
Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint....Pages 661-668
Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites By X-Ray Diffraction....Pages 669-677
X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite....Pages 679-687
Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/SiC Metal Matrix Composite....Pages 689-698
A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel....Pages 699-709
Fracture Analysis of Nodular Cast Iron by X-Ray Fractography....Pages 711-718
X-Ray Fractographic Study On Alumina and Zirconia Ceramics....Pages 719-727
Back Matter....Pages 729-743