Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

1 /f Noise Sources....Pages 3-10
Noise Sources in GaN/AlGaN Quantum Wells and Devices....Pages 11-18
1 /f Noise in Nanomaterials and Nanostructurea: Old Questions in a New Fashion....Pages 19-27
1 /f Spectra as a Consequence of the Randomness of Variance....Pages 29-36
Quantum Phase Locking, 1 /f Noise and Entanglement....Pages 37-44
Shot Noise in Mesoscopic Devices and Quantum Dot Networks....Pages 45-52
Super-Poissonian Noise in Nanostructures....Pages 53-60
Stochastic and Deterministic Models of Noise....Pages 61-68
Noise in Optoelectronic Devices....Pages 71-78
Fluctuations of Optical and Electrical Parameters and Their Correlation of Multiple-Quantum-Well INGAAS/INP Lasers....Pages 79-88
Microwave Noise and Fast/Ultrafast Electronic Processes in Nitride 2DEG Channels....Pages 89-96
Noise of High Temperature Superconducting Bolometers....Pages 97-107
1/ f Noise in MOSTs: Faster is Noisier....Pages 109-120
Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs....Pages 121-128
Noise and Tunneling Through the 2.5 nm Gate Oxide in Soi MOSFETs....Pages 129-136
Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors....Pages 137-144
Noise Modelling in Low Dimensional Electronic Structures....Pages 145-152
Correlation Noise Measurements and Modeling of Nanoscale MOSFETs....Pages 153-160
Tunneling Effects and Low Frequency Noise of GaN/GaAlN HFETs....Pages 161-168
High Frequency Noise Sources Extraction in Nanometique MOSFETs....Pages 169-176
Iiformative “Passport Data” of Surface Nano- and Mocrostrucures....Pages 177-186
Noise Measurement Technique....Pages 189-202
Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures....Pages 203-210
Correlation Spectrum Analyzer: Pringiples and Limits in Noise Measurements....Pages 211-218
Measurement and Analysis Methods for Random Telegraph Signals....Pages 219-226
RTS in Quantum Dots and MOSFETs: Experimental Set-Up with Long-Time Stability and Magnetic Field Compensation....Pages 227-236
Some Considerations for the Construction of Low-Noise Amplifiers in Very Low Frequency Region....Pages 237-244
Measurements of Low Frequency Noise in Nano-Grained RuO 2 +Glass Films Below 1 K....Pages 245-252
Technique for Investigation of Non-Gaussian and Non-Stationary Properties of LF Noise in Nanoscale Semiconductor Devices....Pages 253-260
The Noise Background Suppression of Noise Measuring Set-UP....Pages 261-270
Accuracy of Noise Measurements for 1/ f and GR Noise....Pages 271-278
Radiofrequency and Microwave Noise Metrology....Pages 279-286
Treatment of Noise Data in Laplace Plane....Pages 287-292
Measurement of Noise Parameter Set in the Low Frequency Range: Requirements and Instrumentation....Pages 293-302
Techniques of Interference Reduction in Probe System for Wafer Level Noise Measurements of Submicron Semiconductor Devices....Pages 303-309
Hooge Mobility Fluctuations in n-InSb Magnetoresistors As a Reference for Access Resistance LF-Noise Measurements of SiGe Metamorphic HMOS FETs....Pages 311-318
Optimised Preamplifier for LF-Noise MOSFET Characterization....Pages 319-326
Net of YBCO and LSMO Thermometers for Bolometric Applications....Pages 327-336
Diagnostics of GaAs Light Emitting Diode pn Junctions....Pages 337-344
New Tools For Fast And Senstive Noise Measurements....Pages 345-354
Using a Novel, Computer Controlled Automatic System for LF Noise Measurements Under Point Probes....Pages 355-362