Treatise on Materials Science & Technology 27

Content: 
Inside Front Cover
Page ii

Front Matter
Page iii

Copyright page
Page iv

Contributors
Page ix

Preface
Page xi
K.N. Tu, R. Rosenberg

1 - Submicron Structure and Microanalysis
Pages 3-11
K.N. TU, R. ROSENBERG

2 - Synchrotron Radiation Photoemission Studies of Interfaces
Pages 15-63
J.H. WEAVER

3 - ESCA
Pages 65-109
NILS MÅRTENSSON

4 - Modern Developments in Soft X-Ray Imaging
Pages 111-141
D.M. SHINOZAKI, R. FEDER

5 - X-Ray Diffraction Analysis of Strains and Stresses in Thin Films
Pages 143-200
ARMIN SEGMÜLLER, MASANORI MURAKAMI

6 - X-Ray Diffraction Analysis of Diffusion in Thin Films
Pages 201-248
MASANORI MURAKAMI, ARMIN SEGMÜLLER, KING-NING TU

7 - Cross-Sectional Transmission Electron Microscopy of Electronic and Photonic Devices
Pages 251-296
T.T. SHENG

8 - High-Resolution Transmission Electron Microscopy of Surfaces and Interfaces
Pages 297-335
D. CHERNS

9 - Scanning Transmission Electron Microscopy
Pages 337-387
P.E. BATSON

10 - Rutherford Backscattering Spectrometry on Thin Solid Films
Pages 391-447
TERJE G. FINSTAD, WEI-KAN CHU

11 - The Atomic Structure and Atomic Layer Compositional Analysis of Thin Solid Films Using the Time-of-Flight Atom-Probe Field Ion Microscopy
Pages 449-478
T.T. TSONG

Index
Pages 479-484

Contents of Previous Volumes
Pages 485-493