Surface Science Tools for Nanomaterials Characterization

Front Matter....Pages i-x
Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)....Pages 1-67
Recovering Time-Resolved Imaging Forces in Solution by Scanning Probe Acceleration Microscopy: Theory and Application....Pages 69-89
Scanning Probe Microscopy for Nanolithography....Pages 91-115
Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology....Pages 117-158
Field Ion Microscopy for the Characterization of Scanning Probes....Pages 159-198
Scanning Conductive Torsion Mode Microscopy....Pages 199-225
Field Ion and Field Desorption Microscopy: Principles and Applications....Pages 227-272
Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces....Pages 273-316
Applications of Synchrotron-Based X-Ray Photoelectron Spectroscopy in the Characterization of Nanomaterials....Pages 317-366
Exploration into the Valence Band Structures of Organic Semiconductors by Angle-Resolved Photoelectron Spectroscopy....Pages 367-404
Band Bending at Metal-Semiconductor Interfaces, Ferroelectric Surfaces and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy....Pages 405-461
Higher Resolution Scanning Probe Methods for Magnetic Imaging....Pages 463-487
Imaging and Characterization of Magnetic Micro- and Nanostructures Using Force Microscopy....Pages 489-529
Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures....Pages 531-559
High Resolution STM Imaging....Pages 561-619
Numerical and Finite Element Simulations of Nanotips for FIM/FEM....Pages 621-643
Back Matter....Pages 645-652