Speckle Metrology

Content: 
QUANTUM ELECTRONICS – PRINCIPLES AND APPLICATIONS, Page ii
Front Matter, Page iii
Copyright, Page iv
Dedication, Page v
LIST OF CONTRIBUTORS, Page xi
PREFACE, Pages xiii-xiv
CHAPTER 1 - INTRODUCTION, Pages 1-4, Robert K. Erf
CHAPTER 2 - PHYSICAL PROPERTIES OF SPECKLES, Pages 5-9, H.J. Tiziani
CHAPTER 3 - SURFACE ROUGHNESS MEASUREMENT, Pages 11-49, Toshimitsu Asakura
CHAPTER 4 - DISPLACEMENT AND STRAIN MEASUREMENT, Pages 51-71, Yau Y. Hung
CHAPTER 5 - VIBRATION ANALYSIS AND DEFORMATION MEASUREMENT, Pages 73-110, H.J. Tiziani
CHAPTER 6 - ELECTRONIC SPECKLE PATTERN INTERFEROMETRY, Pages 111-158, John N. Butters, Robert Jones, Catherine Wykes
CHAPTER 7 - MEASUREMENT OF MOTION PATHS, Pages 159-181, Gerd P. Weigelt
CHAPTER 8 - TOPOLOGICAL SPECKLE AND STRUCTURES INSPECTION, Pages 183-223, D.A. Gregory
9.1 - Miscellaneous Applications, Pages 225-245, Robert K. Erf
9.2 - Measurement of Crystal Length Changes, Pages 247-256, A. Luxmoore, F.A.A. Amin
9.3 - Measurement of Displacements Around Crack Tips, Pages 257-266, A. Luxmoore
9.4 - Transient Phenomena Analysis, Pages 267-280, Germán Da Costa
9.5 - Scattered Light Speckle Interferometry, Pages 281-293, M.E. Fourney
CHAPTER 10 - MISCELLANEOUS TOPICS IN SPECKLE METROLOGY, Pages 295-320, K.A. Stetson
INDEX, Pages 321-331