Practical Fourier Transform Infrared Spectroscopy. Industrial and laboratory chemical analysis

Content: 
Front Matter, Page iii
Copyright, Page iv
Contributors, Pages ix-x
Preface, Pages xi-xii
Acknowledgments, Page xiii, John R. Ferraro, K. Krishnan
1 - The Use of Vibrational Spectroscopy in the Characterization of High-Critical-Temperature Ceramic Superconductors, Pages 1-39, Victor A. Maroni, John R. Ferraro
2 - The Use of Vibrational Spectroscopy in the Characterization of Synthetic Organic Electrical Conductors and Superconductors, Pages 41-101, John R. Ferraro, Jack M. Williams
3 - FT-IR Microsampling Techniques, Pages 103-165, K. Krishnan, S.L. Hill
4 - Possibilities and Limitations of FT-Raman Spectroscopy, Pages 167-202, B. Schrader
5 - Vibrational Circular Dichroism: Comparison of Techniques and Practical Considerations, Pages 203-284, Timothy A. Keiderling
6 - Characterization of Semiconductor Silicon Using Fourier Transform Infrared Spectrometry, Pages 285-349, K. Krishnan, P.J. Stout, Masaharu Watanabe
7 - Industrial Applications of FT-IR, Pages 351-394, H. Ishida, A. Ishitani
8 - Multivariate Calibration Methods Applied to Quantitative FT-IR Analyses, Pages 395-468, David M. Haaland
9 - Industrial Applications of GC/FT-IR, Pages 469-518, Ryujiro Namba
Index, Pages 519-534