Modern Developments and Applications in Microbeam Analysis

Front Matter....Pages I-XI
Recent Developments in Instrumentation for X-Ray Microanalysis....Pages 1-9
High Resolution Non Dispersive X-Ray Spectroscopy with State of the Art Silicon Detectors....Pages 11-19
Efficiency Calibration of a Si(Li) Detector by EPMA....Pages 21-28
Wavelength-Dispersive X-Ray Spectrometry....Pages 29-36
X-Ray Spectrum Processing and Multivariate Analysis....Pages 37-47
Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope....Pages 49-57
On the Spatial Resolution in Analytical Electron Microscopy....Pages 59-64
Contamination in Analytical Electron Microscopy and in ALCHEMI....Pages 65-71
Analytical Electron Microscopy of Diffusional Interfaces in an Al-22 at.% Zn Alloy....Pages 73-76
Quantitative TEM-EDXS of Sol-Gel Derived PZT Ceramic Materials....Pages 77-82
Particulate Composites of TZP-Chromium Oxide and TZP-Chromium Carbide; Microbeam Investigations....Pages 83-86
Cryo-Electron Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Energy-Dispersive X-Ray Analysis of Ag(Br, I) Nano- and Microcrystals....Pages 87-92
Electron Energy-Loss Near-Edge Structure of Alumina Polymorphs....Pages 93-96
SPM Study of YBCO Films Prepared by Plasma Assisted Laser Ablation....Pages 97-100
Surface Characterisation and Modification of YBCO Thin Films by STM....Pages 101-107
Quantitative Near-Surface Microanalysis and Depth Profiling by EPMA....Pages 109-123
EPMA Sputter Depth Profiling, Part I: Theory and Evaluation....Pages 125-131
EPMA Sputter Depth Profiling, Part II: Experiment....Pages 133-139
Quantitative Analysis of BN (C, O, Ar, H)-Coatings Using EPMA and SIMS....Pages 141-147
Quantitative EDS Analysis of SiO 2 /Al 2 O 3 /TiO 2 Multilayer Films....Pages 149-154
Surface Ionization of Thin Films on Substrates: Measurement and Simulation....Pages 155-161
Comparison of Different Methods to Characterize Thin a-Si:H Films....Pages 163-170
EPMA Studies of the Growth of Thin Surface Coatings Produced by Evaporation....Pages 171-176
Analysis of Thin Films with Slightly Rough Boundaries....Pages 177-180
Effect of Chromium Substrate Pretreatment on Diamond Growth by the Chemical Vapour Deposition Method....Pages 181-186
EPMA Determination of Arsenic Excess in Low Temperature Grown GaAs....Pages 187-189
EPMA of Melted UO 2 Fuel Rods from the Phebus-FP Reactor Accident Experiment....Pages 191-200
Steels, Carbon Concentration, and Microhardness....Pages 201-205
Determination of Chemical and Phase Composition of Fly-Ashes by Combined EPMA and XRD Methods....Pages 207-210
EPMA of the Composition of Opal-Based Nanostructured Materials....Pages 211-217
NDIC and EMP Study of Plagioclase Mineral Zoning: An Example from Nea Kameni Lavas....Pages 219-225
Compositional X-Ray Maps of Metamorphic and Magmatic Minerals....Pages 227-235
Chemical Mapping of Weathering Stages in Laterites....Pages 237-246
Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group Elements in Sulphides and Sulpharsenides: Problems, Solutions, and Applications....Pages 247-252
Composition of 15–17th Century Archaeological Glass Vessels Excavated in Antwerp, Belgium....Pages 253-267
Potassium Migration in Silica Glass During Electron Beam Irradiation....Pages 269-272
X-Ray Microanalysis of Frozen-Hydrated Biological Bulk Samples....Pages 273-282
Environmental SEM and X-Ray Microanalysis of Biological Materials....Pages 283-293
Effects of Electron-Beam/Gas Interactions on X-Ray Microanalysis in the Variable Pressure SEM....Pages 295-300
The Analytical Signal in EPMA and the Influence of the Electric Field Created by the Primary Beam....Pages 301-305
Standardless Analysis....Pages 307-316
A New Technique for Standardless Analysis by EPMA-TWIX....Pages 317-320
Stopping Power Factor for Standardless QEPMA....Pages 321-324
On the Measurement of the Backscattering Coefficient for Low Energy Electrons....Pages 325-331
Monte Carlo Simulations of Edge Artefacts in MULSAM Images....Pages 333-339
Assessment of the Inelastic Scattering Model in Monte-Carlo Simulations....Pages 341-349
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs....Pages 351-363
Fractals and BaTiO3-Ceramic Microstructure Analysis....Pages 365-369
Fragmentation of Sputtered Cluster Ions of Transition Metals: Distributions of Lifetimes and Internal Energies....Pages 371-377
Sputtering of Tantalum by Atomic and Molecular Gold Ions: Comparative Study of Yields and Kinetic Energy Distributions of Atomic and Cluster Ions....Pages 379-385
The Standards, Measurements and Testing Programme (SMT), the European Support to Standardisation, Measurements and Testing Projects....Pages 387-392