Microbeam and Nanobeam Analysis

Front Matter....Pages I-XI
Monte Carlo Simulation Techniques for Quantitative X-Ray Microanalysis....Pages 1-12
Transport Equation Approach to Electron Microbeam Analysis: Fundamentals and Applications....Pages 13-38
Use of Soft X-Rays in Microanalysis....Pages 39-60
Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region....Pages 61-86
Synchrotron Radiation Induced X-Ray Microfluorescence Analysis....Pages 87-115
Particle-Induced X-Ray Emission — A Quantitative Technique Suitable for Microanalysis....Pages 117-133
Cathodoluminescence Microscopy and Spectroscopy of Semiconductors and Wide Bandgap Insulating Materials....Pages 135-166
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)....Pages 167-182
Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe....Pages 183-194
Microanalysis at Atomic Resolution....Pages 195-207
Composition of Vanadium Carbides Formed by Solidification in Fe-V-C-M Alloys: Influence of Additions (M = Al, Cu, Mo)....Pages 209-216
Electron Transmission Coefficient for Oblique Angle of Incidence....Pages 217-224
Depth Distribution Function for Oblique Angle of Incidence....Pages 225-232
Simulation of EDS Spectra Using X-RES Software....Pages 233-240
On the Use of the GeLα Line in Thin Film X-Ray Microanalysis of Si 1-x Ge x /Si Heterostructures....Pages 241-249
Computer Simulations of the X-Ray Intensity Distribution from Submicron Particles Embedded in a Matrix....Pages 251-257
Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS....Pages 259-269
Quantitative Analysis of the Compound Layer of Plasma Nitrided Pure Iron....Pages 271-277
Correction of the Edge Effect in Auger Electron Microscopy....Pages 279-287
Low Energy Imaging of Nonconductive Surfaces in SEM....Pages 289-298
Investigation of the Bonding Mechanism of Glass Ceramic Layers on Metal Alloys....Pages 299-305
Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples....Pages 307-316
SIMS Linescan Profiling of Chemically Bevelled Semiconductors: A Method of Overcoming Ion Beam Induced Segregation in Depth Profiling....Pages 317-324
Experimental Verification of Theoretical Models Simulating the Temperature Increase in EPMA of Glass....Pages 325-332
Quantitation of Mineral Elements of Different Fruit Pollen Grains....Pages 333-338
Electron Beam Induced Migration of Alkaline Ions in Silica Glass....Pages 339-347
Application of the Boltzmann Transport Equation in the Thickness Determination of Thin Films....Pages 349-353
Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images....Pages 355-361
Calculation of the Surface Ionisation Using Analytical Models of Electron Backscattering....Pages 363-376
Thickness Determination of Thin Insulating Layers....Pages 377-389
High Energy and Angular Resolution Dynamic Secondary Ion Mass Spectrometry....Pages 391-398
EPMA and Mass Spectrometry of Soil and Grass Containing Radioactivity from the Nuclear Accident at Chernobyl....Pages 399-408
Application of a New Monte Carlo Simulation Algorithm to Electron Probe Microanalysis....Pages 409-417
Topography Development on Single Crystal MgO Under Ion Beam Bombardment....Pages 419-424
Determination of SPM TIP Shape Using Polystyrene Latex Balls....Pages 425-433
Combined Characterization of Nanostructures by AEM and STM....Pages 435-442
Study of Quasi-Fractal Many-Particle-Systems and Percolation Networks by Zero-Loss Spectroscopic Imaging, Electron Energy-Loss Spectroscopy and Digital Image Analysis....Pages 443-451
Calculation of Bremsstrahlung Spectra for Multilayer Samples....Pages 453-462
Thickness Measurement of Thin Films by EPMA — Influence of ø(0), MAC’s and Substrate....Pages 463-471
A Simple Procedure to Check the Spectral Response of an EDX Detector....Pages 473-477
Virtual WDS....Pages 479-483
Monte Carlo Simulation Program with a Free Configuration of Specimen and Detector Geometries....Pages 485-492
Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays....Pages 493-500
Measurements of Ga 1-x Al x As Layers on GaAs with EDS....Pages 501-506
The Relative Intensity Factor for Lα Radiation Considering the Different Mass Absorption of Lα and Lβ Radiation....Pages 507-515
Determination of the Solubility of Cerium in BaTiO 3 by Quantitative WDS Electron Probe Microanalysis....Pages 517-523
Simulation of X-Ray Diffraction Profiles of Gradually Relaxed Epilayers....Pages 525-531
Monte Carlo Simulation of Electron Scattering for Arbitrary 2D Structures Using a Modified Quadtree Geometry Discretization....Pages 533-544
Chemical-Bond Characterization of Nanostructures by EELS....Pages 545-552
Local Determination of Carbon by Combining Beta-Autoradiography and Electron Microprobe Analysis....Pages 553-558
The Check of the Elastic Scattering Model in Monte-Carlo Simulation....Pages 559-572
True Colour X-Ray Vision for Electron Microscopy and Microanalysis....Pages 573-579
Determination of the Oxidation States of Nb by Auger Electron Spectroscopy....Pages 581-586
Study by SIMS of the 54 Cr and 18 O Diffusion in Cr 2 O 3 and in Cr 2 O 3 Scales....Pages 587-595
Comparison of Back-Foil Scanning X-Ray Microfluorescence and Electron Probe X-Ray Microanalysis for the Elemental Characterisation of Thin Coatings....Pages 597-603
Electron Probe X-Ray Microanalysis of Coatings....Pages 605-610
Analysis of Layers: X-Ray Maps of Change in Thickness Obtained by Electron Macroprobe....Pages 611-622
Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units....Pages 623-629
Practical Aspects and Applications of EPMA at Low Electron Energies....Pages 631-638
Oxidation and Reduction Processes of Be/BeO Induced by Electrons....Pages 639-643