Ion Beam Analysis. Proceedings of the Fourth International Conference on Ion Beam Analysis, Aarhus, June 25–29, 1979

Content: 
Front Matter, Page v
Copyright, Page vi
PREFACE, Page vii, H.H. Andersen, J. Bøttiger, H. Knudsen
Key to Conference Photograph, Pages viii-ix
STRAGGLING IN ENERGY LOSS OF ENERGETIC HYDROGEN AND HELIUM IONS, Pages 1-15, F. BESENBACHER, J.U. ANDERSEN, E. BONDERUP
THE STOPPING OF ENERGETIC IONS IN SOLIDS, Pages 17-24, J.F. ZIEGLER
ENERGY-LOSS STRAGGLING OF ALPHA PARTICLES IN Al, Ni AND Au, Pages 25-27, E. FRIEDLAND, J.M. LOMBAARD
SEARCH FOR THE INFLUENCE OF CHEMICAL EFFECT ON THE STOPPING POWER: THE CASE OF OXIDES, Pages 29-31, G. BLONDIAUX, M. VALLADON, K. ISHII, J.L. DEBRUN
STOPPING RATIOS OF 50–300 keV LIGHT IONS IN METALS, Pages 33-39, P. MERTENS, Th. KRIST
HYDROGEN AND HELIUM STOPPING POWERS OF RARE-EARTH METALS, Pages 41-50, H. KNUDSEN, H.H. ANDERSEN, V. MARTINI
ENERGY LOSS OF LIGHT IONS IN DIAMOND, Pages 51-55, R.W. FEARICK, J.P.F. SELLSCHOP
ELECTRONIC ENERGY LOSS OF H, D AND He IN Au BELOW 20 keV, Pages 57-62, R. BLUME, W. ECKSTEIN, H. VERBEEK
STOPPING POWERS AND BACKSCATTERED CHARGE FRACTIONS FOR 20–150 keV H+ AND He+ ON GOLD, Pages 63-68, D.A. THOMPSON, W.F.S. POEHLMAN
RANGE PARAMETERS OF PROTONS IN SILICON IMPLANTED AT ENERGIES FROM 0.5 TO 300 keV, Pages 69-74, F.-J. DEMOND, S. KALBITZER, H. MANNSPERGER, G. MÜLLER
STOPPING POWER AND STRAGGLING OF 80–500 keV LITHIUM IONS IN C, Al, Ni, Cu, Se, Ag, AND Te, Pages 75-80, H.H. ANDERSEN, F. BESENBACHER, P. GODDIKSEN
ENERGY LOSS OF PROTONS IN Si, Ge AND Mo, Pages 81-84, SH.Z. IZMAILOV, E.I. SIROTININ, A.F. TULINOV
NUCLEAR CROSS SECTIONS FOR ION BEAM ANALYSIS, Pages 85-91, J.R. BIRD
MICROANALYSIS OF FLUORINE BY NUCLEAR REACTIONS: I. 19F(p, α0)16O and 19F(p, α γ)16O reactions, Pages 93-103, D. DIEUMEGARD, B. MAUREL, G. AMSEL
THE 14N(d,p5)15N CROSS SECTION, 0.32–1.45 MeV, Pages 105-109, A. NIILER, R. BIRKMIRE
A NOTE ON THE 3He + D NUCLEAR-REACTION CROSS SECTION, Pages 111-114, W. MÖLLER, F. BESENBACHER
PROTON INDUCED γ-RAY YIELDS, Pages 115-120, M.J. KENNY, J.R. BIRD, E. CLAYTON
QUANTITATIVE MICROANALYSIS BY HEAVY ION BEM INDUCED X-RAY EXCITATION, Pages 121-123, I.V. MITCHELL, W.N. LENNARD, J.B. SANDERS
DETERMINATION OF OXYGEN IN THIN FILMS WITH THE 16O(3He, pγ)18F REACTION, Pages 125-129, J.C.P. HEGGIE, Z.E. SWITKOWSKI, G.J. CLARK
A COMPARISON OF THIN AND THICK TARGET METHODS OF MEASURING PROTON-INDUCED K-SHELL IONIZATION CROSS-SECTIONS, Pages 131-138, K.M. BARFOOT, I.V. MITCHELL, H.L. ESCHBACH, W.B. GILBOY
HIGH RESOLUTION SCANNING ION PROBES: APPLICATIONS TO PHYSICS AND BIOLOGY, Pages 139-149, R. LEVI-SETTI, T.R. FOX
USE OF NON-COULOMB H ION BACKSCATTERING TO CHARACTERIZE THICK ANODIZED ALUMINUM FILMS, Pages 151-155, C.R. GOSSETT
SURFACE TOPOLOGY USING RUTHERFORD BACKSCATTERING, Pages 157-162, R.D. EDGE, U. BILL
EFFECTS OF SURFACE ROUGHNESS ON BACKSCATTERING SPECTRA, Pages 163-167, A.R. KNUDSON
A GOLD AND ALUMINIUM IMPLANTED STANDARD FOR ION BEAM EXPERIMENTS, Pages 169-174, I.V. MITCHELL, H.L. ESCHBACH, K.M. BARFOOT
IRRADIATION CHAMBER AND SAMPLE CHANGER FOR BIOLOGICAL SAMPLES, Pages 175-179, G. KRAFT, H.W. DAUES, B. FISCHER, U. KOPF, H.P. LIEBOLD, D. QUIS, H. STELZER, J. KIEFER, F. SCHÖPFER, E. SCHNEIDER, K. WEBER, H. WULF, H. DERTINGER
THE HIGH SENSITIVITY MEASUREMENT OF CARBON USING THE NUCLEAR MICROPROBE, Pages 181-185, F.C.W. PUMMERY, J.W. McMILLAN
A NEW TECHNIQUE FOR BACKSCATTERING ANALYSIS, Pages 187-190, P.W. KEATON, P.S. PEERCY, B.L. DOYLE, C.J. MAGGIORE
ELIMINATION OF THE BEAM EFFECT ON CHANNELING DIPS OF BISMUTH IMPLANTED IN SILICON, Pages 191-194, A.G. WAGH, S. RADHAKRISHNAN, S.G. GAONKAR, M.J. KANSARA
DECHANNELLING AND THE NATURE OF DEFECT STRUCTURES IN NATURAL TYPE Ia DIAMONDS, Pages 195-202, R.W. FEARICK, J.P.F. SELLSCHOP
THE NUCLEAR MICROPROBE DETERMINATION OF THE SPATIAL DISTRIBUTION OF STABLE ISOTOPE TRACERS, Pages 203-209, P.M. HIRST, J.W. MCMILLAN, D.J. MALCOLME-LAWES
CHARACTERIZATION OF AMORPHOUS SILICON FILMS BY RUTHERFORD BACKSCATTERING SPECTROMETRY, Pages 211-215, K. KUBOTA, T. IMURA, M. IWAMI, A. HIRAKI, M. SATOU, F. FUJIMOTO, Y. HAMAKAWA, S. MINOMURA, K. TANAKA
A METHOD FOR DETERMINING DEPTH PROFILES OF TRANSITION ELEMENTS IN STEELS, Pages 217-221, C.R. GOSSETT
DEPTH PROFILING OF DEUTERIUM WITH THE D(3He,p)4He REACTION, Pages 223-225, D. DIEUMEGARD, D. DUBREUIL, G. AMSEL
COINCIDENCE MEASUREMENTS BETWEEN SCATTERED PARTICLES AND X-RAYS TO OBTAIN HIGH DEPTH AND MASS RESOLUTION, Pages 227-232, G. BAHIR, R. KALISH, I. TSERRUYA
ION BEAM MONITORING USING THIN SELF-SUPPORTING REFERENCE FOILS, Pages 233-240, I.V. MITCHELL, K.M. BARFOOT, H.L. ESCHBACH
HEAVY ION MICROLITHOGRAPHY - A NEW TOOL TO GENERATE AND INVESTIGATE SUBMICROSCOPIC STRUCTURES, Pages 241-246, BERND EBERHARD FISCHER, REIMAR SPOHR
A NEW ELECTROSTATIC ION MICROPROBE SYSTEM, Pages 247-249, P. KREJCIK, J.C. KELLY, R.L. DALGLISH
TRACE ELEMENT DETECTION SENSITIVITY IN PIXE ANALYSIS BY MEANS OF AN EXTERNAL PROTON BEAM, Pages 251-257, B. RAITH, H.R. WILDE, M. ROTH, A. STRATMANN, B. GONSIOR
ADVANCES IN THE USE OF PIXE AND PESA FOR AIR POLLUTION SAMPLING, Pages 259-263, G.M. HUDSON, H.C. KAUFMANN, J.W. NELSON, M.A. BONACCI
ION-BEAM-INDUCED MIGRATION AND ITS EFFECT ON CONCENTRATION PROFILES, Pages 265-274, S.M. MYERS
LASER INDUCED SURFACE ALLOY FORMATION AND DIFFUSION OF ANTIMONY IN ALUMINIUM, Pages 275-282, ANIMESH K. JAIN, V.N. KULKARNI, D.K. SOOD, M. SUNDARARAMAN, R.D.S. YADAV
THE APPLICATION OF LOW ANGLE RUTHERFORD BACKSCATTERING AND CHANNELLING TECHNIQUES TO DETERMINE IMPLANTATION INDUCED DISORDER PROFILE DISTRIBUTIONS IN SEMICONDUCTORS, Pages 283-288, N.A.G. AHMED, C.E. CHRISTODOULIDES, G. CARTER, M.J. NOBES, A.I. TITOV
THE APPLICATION OF ION BEAM METHODS TO DIFFUSION AND PERMEATION MEASUREMENTS, Pages 289-294, W. MÖLLER, B.M.U. SCHERZER, R. BEHRISCH
D AND 3He TRAPPING AND MUTUAL REPLACEMENT IN MOLYBDENUM, Pages 295-299, R. SCHULZ, R. BEHRISCH, B.M.U. SCHERZER
DEUTERIUM ENRICHMENT DURING ION BOMBARDMENT IN VD0.01 ALLOYS, Pages 301-305, S. YAMAGUCHI, K. OZAWA, O. YOSHINARI, M. KOIWA, M. HIRABAYASHI
ION-BEAM-INDUCED ANNEALING EFFECTS IN GaAs, Pages 307-312, J.S. WILLIAMS, M.W. AUSTIN
(110) Si SURFACE PEAK ANALYSIS BY 100–350 keV PROTONS, Pages 313-315, H.H. HUBBES, B. SCHMIEDESKAMP, H.E. ROOSENDAAL, H.O. LUTZ
DEPENDENCE OF DEFECT STRUCTURES ON IMPLANTED IMPURITY SPECIES IN Al SINGLE CRYSTALS, Pages 317-321, T. HUSSAIN, G. LINKER
ANALYSIS OF THE DECHANNELLING MECHANISM DUE TO DISLOCATIONS, Pages 323-328, L. WIELUŃSKI, D. WIELUŃSKA, G. DELLA MEA, A. TUROS
RECOIL MIXING IN SOLIDS BY ENERGETIC ION BEAMS, Pages 329-342, UFFE LITTMARK, WOLFGANG O. HOFER
ASPECTS OF QUANTITATIVE SECONDARY ION MASS SPECTROMETRY, Pages 343-356, KLAUS WITTMAACK
SPUTTERING RATES OF MINERALS AND IMPLICATIONS FOR ABUNDANCES OF SOLAR ELEMENTS IN LUNAR SAMPLES, Pages 357-365, A.J.T. JULL, G.C. WILSON, J.V.P. LONG, S.J.B. REED, C.T. PILLINGER
TRACE ANALYSIS IN CADMIUM TELLURIDE BY HEAVY ION INDUCED X-RAY EMISSION AND BY SIMS, Pages 367-371, C. SCHARAGER, R. STUCK, P. SIFFERT, J. CAILLERET, CH. HEITZ, G. LAGARDE, D. TENORIO
TOWARDS A UNIVERSAL MODEL FOR SPUTTERED ION EMISSION, Pages 373-377, PETER WILLIAMS, WILLIAM KATZ, C.A. EVANS Jr
ION INDUCED AUGER SPECTROSCOPY, Pages 379-382, E.W. THOMAS, K.O. LEGG, W.A. METZ
DEPTH DISTRIBUTIONS OF LOW ENERGY DEUTERIUM IMPLANTED INTO SILICON AS DETERMINED BY SIMS, Pages 383-387, CHARLES W. MAGEE, SAMUEL A. COHEN, DONALD E. VOSS, DAVID K. BRICE
DISTORTION OF DEPTH PROFILES DURING SPUTTERING: I. General description of collisional mixing, Pages 389-394, P. SIGMUND, A. GRAS-MARTI
DEPTH RESOLUTION OF SPUTTER PROFILING INVESTIGATED BY COMBINED AUGER-X-RAY ANALYSIS OF THIN FILMS, Pages 395-398, H.W. ETZKORN, J. KIRSCHNER
EDGE-EFFECTS CORRECTION IN DEPTH PROFILES OBTAINED BY ION-BEAM SPUTTERING, Pages 399-404, I.S.T. TSONG, G.L. POWER, D.W. HOFFMAN, C.W. MAGEE
SURFACE ROUGHENING OF COPPER BY LOW ENERGY ION BOMBARDMENT, Pages 405-409, V. NAUNDORF, M.-P. MACHT
APPLICATION OF PIXE TO THE MEASUREMENT OF SPUTTER DEPOSITS, Pages 411-414, W. KRÜGER, A. SCHARMANN, H. AFRIDI, G. BRÄUER
DETERMINATION OF CARBON IN EFG SILICON RIBBONS BY NUCLEAR TECHNIQUES AND SIMS, Pages 415-417, M. TOULEMONDE, M. HAGE-ALI, R. STUCK, P. SIFFERT, F.V. WALD, R.O. BELL
LIGHT EMISSION FROM SPUTTERED OXYGEN, Pages 419-423, K.-H. SCHARTNER, H.J. FLAIG, D. HASSELKAMP, A. SCHARMANN
RADIOISOTOPE DETECTION WITH TANDEM ELECTROSTATIC ACCELERATORS, Pages 425-433, H.E. GOVE, D. ELMORE, R. FERRARO, R.P. BEUKENS, K.H. CHANG, L.R. KILIUS, H.W. LEE, A.E. LITHERLAND, K.H. PURSER
A POSSIBLE APPLICATION OF THE SIMS METHOD TO DETERMINE THE PROVENANCE OF ARCHAEOLOGICAL OBJECTS, Pages 435-436, M. DOMAŃSKI, B. WOJTOWICZ-NATANSON
PIXE RESEARCH WITH AN EXTERNAL BEAM, Pages 437-440, JIAN-XIN CHEN, HONG-KOU LI, CHI-GANG REN, GUO-HUN TANG, XI-DE WANG, FU-CHIA YANG, HUI-YING YAO
ION BACKSCATTERING AND X-RAY INVESTIGATIONS OF VIOLIN VARNISH AND WOOD, Pages 441-446, PER ARNE TOVE, DAG SIGURD, STURE PETERSSON
PIXE-PIGME STUDIES OF ARTEFACTS, Pages 447-452, P. DUERDEN, J.R. BIRD, M.D. SCOTT, E. CLAYTON, L.H. RUSSELL, D.D. COHEN
APPLICATIONS OF (n, p) AND (n, α) REACTIONS AND A BACKSCATTERING TECHNIQUE TO FUSION REACTOR MATERIALS, ARCHEOMETRY, AND NUCLEAR SPECTROSCOPY, Pages 453-457, D. FINK, J.P. BIERSACK, H. GRAWE, J. RIEDERER, K. MÜLLER, R. HENKELMANN
ION-BEAM ANALYSIS OF METEORITIC AND LUNAR SAMPLES, Pages 459-467, T.A. TOMBRELLO
RBS AND CHANNELLING ANALYSIS OF As AND Ga IN LASER DOPED SILICON, Pages 469-472, R. BERGER, F. RUDOLF, C. JACCARD, M.E. ROULET, W. LÜTHY, M.R.T. SIREGAR, H.P. WEBER
EVAPORATION LOSS AND DIFFUSION OF ANTIMONY IN SILICON UNDER PULSED LASER IRRADIATION, Pages 473-477, ANIMESH K. JAIN, V.N. KULKARNI, D.K. SOOD, M. SUNDARARAMAN, R.D.S. YADAV
CORRECTION FACTOR FOR HAIR ANALYSIS BY PIXE, Pages 479-483, E.C. MONTENEGRO, G.B. BAPTISTA, L.V. DE CASTRO FARIA, A.S. PASCHOA
INVESTIGATION OF THE SOLID-STATE REACTION BETWEEN NICKEL OXIDE AND ALUMINA BY RUTHERFORD BACKSCATTERING (RBS), Pages 485-489, G. DE ROOS, J.W. GEUS, J.M. FLUIT, J.H. DE WIT
AN INTERFACE – MARKER TECHNIQUE APPLIED TO THE STUDY OF METAL SILICIDE GROWTH, Pages 491-497, J.E.E. BAGLIN, F.M. D\'HEURLE, W.N. HAMMER, S. PETERSSON
NUCLEAR REACTION ANALYSIS OF HYDROGEN IN AMORPHOUS SILICON AND SILICON CARBIDE FILMS, Pages 499-504, E. LIGEON, J. FONTENILLE, R. DANIELOU, A. GUIVARC\'H, M. LE CONTELLEC, J. RICHARD
MEASUREMENTS OF 10Be DISTRIBUTIONS USING A TANDEM VAN DE GRAAFF ACCELERATOR, Pages 505-510, W.A. LANFORD, P.D. PARKER, K. BAUER, K.K. TUREKIAN, J.K. COCHRAN, S. KRISHNASWAMI
THE USE OF PROTON INDUCED X-RAY EMISSION IN THE DESIGN AND EVALUATION OF CATALYSTS, Pages 511-516, JAMES A. CAIRNS, JOHN A. COOKSON
PIXE AND NRA ENVIRONMENTAL STUDIES BY MEANS OF LICHEN INDICATORS, Pages 517-521, A.Z. HRYNKIEWICZ, S. SZYMCZYK, J. KAJFOSZ, M. OLECH
THE USE OF PIXE FOR THE MEASUREMENT OF THORIUM AND URANIUM AT μgg-1 LEVELS IN THICK ORE SAMPLES, Pages 523-528, D.D. COHEN, P. DUERDEN, E. CLAYTON, T. WALL
LIGHT VOLATILES IN DIAMOND: PHYSICAL INTERPRETATION AND GENETIC SIGNIFICANCE, Pages 529-534, J.P.F. SELLSCHOP, C.C.P. MADIBA, H.J. ANNEGARN
NUCLEAR REACTION ANALYSIS FOR MEASURING MOISTURE PROFILES IN GRAPHITE/EPOXY COMPOSITES, Pages 535-539, R.L. SCHULTE, R.J. DEIASI
CHANGES IN THE SURFACE COMPOSITION OF Ag–Pd, Au–Pd AND Cu–Pd ALLOYS UNDER ION BOMBARDMENT, Pages 541-545, G. BETZ, J. MARTON, P. BRAUN
HYDROGEN RATIOS AND PROFILES IN DEPOSITED AMORPHOUS AND POLYCRYSTALLINE FILMS AND IN METALS USING NUCLEAR TECHNIQUES, Pages 547-550, R.E. BENENSON, L.C. FELDMAN, B.G. BAGLEY
BIOMEDICAL APPLICATION OF PIXE IN UNIVERSITY OF LIEGE, Pages 551-556, G. WEBER, G. ROBAYE, J.M. DELBROUCK, I. ROELANDTS, O. DIDEBERG, P. BARTSCH, M.C. DE PAUW
PARTICLE-INDUCED X-RAY EMISSION (PIXE) ANALYSIS OF BIOLOGICAL MATERIALS: PRECISION, ACCURACY AND APPLICATION TO CANCER TISSUES, Pages 557-562, W. MAENHAUT, L. DE REU, H.A. VAN RINSVELT, J. CAFMEYER, P. VAN ESPEN
ELEMENTAL MICROANALYSIS OF BIOLOGICAL AND MEDICAL SPECIMENS WITH A SCANNING PROTON MICROPROBE, Pages 563-569, G.J.F. LEGGE, A.P. MAZZOLINI
ION BEAM INDUCED DESORPTION OF SURFACE LAYERS, Pages 571-577, E. TAGLAUER, W. HEILAND, J. ONSGAARD
ION INDUCED SECONDARY ELECTRON EMISSION AS A PROBE FOR ADSORBED OXYGEN ON TUNGSTEN, Pages 579-583, D. HASSELKAMP, A. SCHARMANN, N. STILLER
ANALYSIS OF SURFACE CONTAMINANT COVERING BY ION-ELECTRON SPECTROSCOPY METHODS, Pages 585-588, M. SOSZKA, W. SOSZKA
Si(001) SURFACE STUDIES USING HIGH ENERGY ION SCATTERING, Pages 589-593, L.C. FELDMAN, P.J. SILVERMAN, I. STENSGAARD
CREATION OF SURFACE DAMAGE ON A NICKEL (110) SURFACE BY BOMBARDMENT WITH 3–30 keV NOBLE GAS IONS, Pages 595-599, L.K. VERHEIJ, E. VAN LOENEN, J.A. VAN DEN BERG, D.G. ARMOUR
HEAVY ION INDUCED DESORPTION OF ORGANIC COMPOUNDS, Pages 601-605, P. DUCK, W. TREU, W. GALSTER, H. FRÖHLICH, H. VOIT
ION-INDUCED ADSORPTION OF OXYGEN AT A Cu(110) SURFACE, Pages 607-609, A.G.J. DE WIT, J.M. FLUIT, TH.M. HUPKENS, R.P.N. BRONCKERS
ABSOLUTE COVERAGE MEASUREMENT OF ADSORBED CO AND D2 ON PLATINUM, Pages 611-615, J.A. DAVIES, P.R. NORTON
AUTHOR INDEX, Pages 617-623