Focusing of Charged Particles

Content: 
CONTRIBUTORS, Page ii
Front Matter, Page iii
Copyright, Page iv
LIST OF CONTRIBUTORS, Page v
EDITOR'S PREFACE, Pages vii-viii, A. SEPTIER
PREFACE, Pages ix-x, PIERRE GRIVET
CONTENTS OF VOLUME II, Page xiii
CHAPTER 1.1 - PARTICLES AND FIELDS: FUNDAMENTAL EQUATIONS, Pages 3-44, Michel Y. Bernard
CHAPTER 1.2 - NUMERICAL SOLUTION OF LAPLACE'S AND POISSON'S EQUATIONS AND THE CALCULATION OF ELECTRON TRAJECTORIES AND ELECTRON BEAMS, Pages 45-99, C. Weber
CHAPTER 1.3 - ANALOGICAL METHODS FOR RESOLVING LAPLACE'S AND POISSONS EQUATIONS, Pages 101-162, Jan C. Francken
CHAPTER 1.4 - MEASUREMENT OF MAGNETIC FIELDS, Pages 163-229, C. Germain
CHAPTER 2.1 - HIGH BRIGHTNESS ELECTRON GUNS, Pages 233-250, M.E. Haine, D. Linder
CHAPTER 2.2 - ELECTROSTATIC LENSES, Pages 251-307, K.-J. Hanszen, R. Lauer
CHAPTER 2.3 - MAGNETIC ELECTRON LENSES, Pages 309-352, C. Fert, P. Durandeau
CHAPTER 2.4 - FOCUSING WITH QUADRUPOLES, DOUBLETS, AND TRIPLETS, Pages 353-410, E. Regenstreif
CHAPTER 2.5 - LENS ABERRATIONS, Pages 411-468, P.W. Hawkes
CHAPTER 2.6 - ELECTRON MICROPROBES, Pages 469-494, T. Mulvey
AUTHOR INDEX, Pages 495-500
SUBJECT INDEX, Pages 501-509