Design And Control Of Intelligent Robotic Systems

Front Matter....Pages I-XXXVIII
Aberration corrected STEM and EELS: Atomic scale chemical mapping....Pages 1-2
An update on the TEAM project — first results from the TEAM 0.5 microscope, and its future development....Pages 3-4
Synchrotron based X-ray Microscopy: state of the art and applications....Pages 5-6
High-resolution spectro-microscopy with low-voltage electrons and double aberration correction....Pages 7-8
Developments of aberration correction systems for current and future requirements....Pages 9-10
STEM Aberration Correction: an Integrated Approach....Pages 11-12
Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials....Pages 13-14
Aberration corrected TEM and STEM for dynamic in situ experiments....Pages 15-16
HREM study of the SrTiO 3 Σ3 (112) grain boundary....Pages 17-18
A Method to Measure Source Size in Aberration Corrected Electron Microscopes....Pages 19-20
Determining resolution in the transmission electron microscope: object-defined resolution below 0.5Å....Pages 21-22
Direct measurement of aberrations by convergent-beam electron holography (CHEF)....Pages 23-24
Atomic Structure of BiFeO 3 -BiCrO 3 film on (111) SrTiO 3 Grown by Dual Cross Beam Pulsed Laser Deposition....Pages 25-26
Demonstration of C C /C S -correction in HRTEM....Pages 27-28
New electron diffraction technique using Cs-corrected annular LACDIF: comparison with electron precession....Pages 29-30
The newly installed aberration corrected dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory....Pages 31-32
Uranium single atom imaging and EELS mapping using aberration corrected STEM and LN2 cold stage....Pages 33-34
Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?....Pages 35-36
Detecting and resolving individual adatoms, vacancies, and their dynamics on graphene membranes....Pages 37-38
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope....Pages 39-40
Design of apochromatic TEM composed of usual round lenses....Pages 41-42
Back-Scattered Electron microscopy in Aberration corrected Electron microscope....Pages 43-44
Structure determination of H-encapsulating clathrate compounds in aberration-corrected STEM....Pages 45-46
Performance of R005 Microscope and Aberration Correction System....Pages 47-48
Optimum operation of Schottky electron sources: brightness, energy spread and stability....Pages 49-50
The MANDOLINE filter and its performance....Pages 51-52
Using a monochromator to improve the resolution in focal-series reconstructed TEM down to 0.5Å....Pages 53-54
First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage....Pages 55-56
Image Information transfer through a post-column energy filter detected by a lens-coupled CCD camera....Pages 57-58
Third-rank computation of electron and ion optical systems with several and rotated Wien filters....Pages 59-60
Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lens....Pages 61-62
Miniature electrostatic-magnetostatic column for electrons....Pages 63-64
Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANES....Pages 65-66
A hybrid electron energy loss spectrometer with simultaneous serial and parallel detection....Pages 67-68
In-focus phase contrast: Present state and future developments....Pages 69-70
The Detective Quantum Efficiency of Electron Area Detectors....Pages 71-72
Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector....Pages 73-74
High speed simultaneous X-ray and electron imaging and spectroscopy at synchrotrons and TEMs....Pages 75-76
The image intensity in Zernike mode with electrons....Pages 77-78
Application of a Hilbert phase plate in transmission electron microscopy of materials science samples....Pages 79-80
Optimal Imaging Parameters in Cs-Corrected Transmission Electron Microscopy with a Physical Phase Plate....Pages 81-82
Electron optical design of the Phase Aberration Corrected Electron Microscope....Pages 83-84
Direct electron detectors for TEM....Pages 85-86
A Newly Developed 64 MegaPixel camera for Transmission Electron Microscopy....Pages 87-88
Characterization of a fiber-optically coupled 8k CCD/CMOS device....Pages 89-90
Direct Single-Electron Imaging using a pnCCD Detector....Pages 91-92
Quantitative TEM and STEM Simulations....Pages 93-94
Quantitative determination of the chemical composition of an alloy by High Angle Annular Dark Field imaging....Pages 95-96
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data....Pages 97-98
First time quantification of the HRTEM information-limit reveals insufficiency of the Young’s-fringe test....Pages 99-100
Quantitative Investigations of the Depth of Field in a Corrected High Resolution Transmission Electron Microscope....Pages 101-102
Quantitative characterisation of surfaces on bi-metallic Pt nanoparticles using combined exit wave restoration and aberration-corrected TEM....Pages 103-104
An HAADF investigation of AlAs-GaAs interfaces using SuperSTEM....Pages 105-106
Spatial Coherence and the Quantitative Interpretation of Atomic Resolution Images....Pages 107-108
Analysis of HRTEM diffractograms from amorphous materials: a simple and minor (but not explained so far?) question revisited....Pages 109-110
HAADF-STEM image simulation of large scale nanostructures....Pages 111-112
Aberration-corrected HRTEM study of incommensurate misfit layer compound interfaces....Pages 113-114
Influence of atomic displacements due to elastic strain in HAADF-STEM simulated images....Pages 115-116
Effects of electron channeling in HAADF intensity....Pages 117-118
Analysis of the mechanism of N incorporation in N-doped GaAs quantum wells....Pages 119-120
Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs Factors....Pages 121-122
Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography....Pages 123-124
PPA: An Improved Implementation of Peak Pairs procedure as a DM plug-in for Strain Mapping....Pages 125-126
Domain structure in Delithiated LiFePO 4 , a cathode material for Li ion Battery Applications....Pages 127-128
New Approach to Quantitative ADF STEM....Pages 129-130
Reconstruction of the projected crystal potential in high-resolution transmission electron microscopy....Pages 131-132
Three-dimensional atomic-scale structure of size-selected nanoclusters on surfaces....Pages 133-134
Direct retrieval of a complex wave from its diffraction pattern....Pages 135-136
HRTEM evaluation of iron in acid treated ground vermiculite from Santa Olalla (Huelva, Spain)....Pages 137-138
Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy....Pages 139-140
Quantitative local strain analysis of Si/SiGe heterostructures using HRTEM....Pages 141-142
Displacement field analysis around hydrogen implantation induced platelets (HIPs) in semi-conductors....Pages 143-144
Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron Microscopy....Pages 145-146
A novel emission potential multislice method to calculate intensity contributions for thermal diffuse scattering in plane wave illumination TEM....Pages 147-148
Three-dimensional HREM Structure Retrieval....Pages 149-150
Description of electron microscope image details based on structure relaxations with enhanced interaction potentials....Pages 151-152
Computation and parametrization of Debye-Waller temperature factors for sphalerite type II-VI, III-V and group IV semiconductors....Pages 153-154
Structural Investigation of Amorphous/Crystalline Interfaces by Iterative Digital Image Series Matching....Pages 155-156
Novel carbon nanosheets as support foils for ultrahigh resolution TEM studies of nanoobjects....Pages 157-158
Quantitative HRTEM studies of reconstructed exit-plane waves retrieved from C S -corrected electron microscopes....Pages 159-160
Geometrical phase analysis of the 1:1 cation ordered domains in complex perovskite ferroelectrics....Pages 161-162
The Stobbs factor in HRTEM: Hunt for a phantom?....Pages 163-164
Measuring coherence in an electron beam for imaging....Pages 165-166
Argand plot: a sensitive fingerprint for electron channelling....Pages 167-168
Atomic-resolution studies of In 2 O 3 -ZnO compounds on aberration -corrected electron microscopes....Pages 169-170
Advances in automated diffraction tomography....Pages 171-172
Identification/ fingerprinting of nanocrystals by precession electron diffraction....Pages 173-174
On the Origin and Asymmetry of High Order Laue Zone Lines Splitting in Convergent Beam Electron Diffraction....Pages 175-176
Precession electron diffraction: application to organic crystals and hybrid inorganic-organic materials....Pages 177-178
Structural studies of amorphous materials using RDF, RMC and DFT refinement....Pages 179-180
A Nanoprobe Electron Diffraction Study of Surface Phases in LiCoO 2 ....Pages 181-182
Structural features of RF magnetron sputter deposited Al-Fe and Al-Cu thin films....Pages 183-184
Structural Investigation of a Layered Carbon Nitride Polymer by Electron Diffraction....Pages 185-186
Measuring the particle density of a nanocrystal deposit using DF images and a reciprocal space analysis....Pages 187-188
Towards a quantitative understanding of precession electron diffraction....Pages 189-190
Electron crystallography by quantitative CHEF....Pages 191-192
Precession Electron Diffraction for the characterization of twinning in pseudo-symmetrical crystals: case of coesite....Pages 193-194
Electron precession characterization of pseudo-merohedral twins in the LaGaO 3 perovskite....Pages 195-196
Kikuchi electron double diffraction....Pages 197-198
The structure of the complex oxide PbMnO 2.75 solved by precession electron diffraction....Pages 199-200
Software Precession Electron Diffraction....Pages 201-202
A new method for electron diffraction based analysis of phase fractions and texture in thin films of metallic nano-crystals....Pages 203-204
Local structures of metallic glasses studied by experimental RDF and model refinement....Pages 205-206
Three groups of hexagonal phases and their relation to the i-phase in Zn-Mg-RE alloy....Pages 207-208
Diffraction analysis of incommensurate modulation in “chain-ladder” composite crystal (Sr/Ca) 14 Cu 24 O 41 ....Pages 209-210
Contribution of electron precession to the study of crystals displaying small symmetry departures....Pages 211-212
The symmetry of microdiffraction electron precession patterns....Pages 213-214
Measurement of GaAs structure factors from the diffraction of parallel and convergent electron nanoprobes....Pages 215-216
Differential Electron Diffraction....Pages 217-218
Atomic Structure Determination by “Observing” Structural Phase in 3-Beam CBED Patterns....Pages 219-220
Automatic space group determination using precession electron diffraction patterns....Pages 221-222
Compositional dependence of the (200) electron diffraction in dilute III–V semiconductor solid solutions....Pages 223-224
Investigation of the local crystal lattice parameters in SiGe nanostructures by convergent-beam electron diffraction analysis....Pages 225-226
Computer simulation of electron nanodiffraction from polycrystalline materials....Pages 227-228
An analytical approach of the HOLZ lines splitting on relaxed samples....Pages 229-230
ELDISCA C# — a new version of the program for identifying electron diffraction patterns....Pages 231-232
Mixing Real and Reciprocal Space....Pages 233-234
Structure solution of intermediate tin oxide, SnO 2−x , by electron precession....Pages 235-236
“Phase-scrambling” multislice simulations of precession electron diffraction....Pages 237-238
High-Resolution Electron Holography on Ferroelectrics....Pages 239-240
Imaging parameters for optimized noise properties in high-resolution off-axis holograms in a Cs-corrected TEM....Pages 241-242
Partial coherence in inelastic holography....Pages 243-244
FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holography....Pages 245-246
Modelling kink vortices in high- T c superconductors....Pages 247-248
Off-axis electron holography of FIB-prepared semiconductor specimens with mV sensitivity....Pages 249-250
Off-axis electron holography and the FIB, a systematic study of the artefacts observed in semiconductor specimens....Pages 251-252
Analytical TEM and electron holography of magnetic field distribution in nanocrystalline Co layers deposited on Cu....Pages 253-254
Electron Holography with Cs-corrected Tecnai F20 — elimination of the incoherent damping introduced by the biprism in conventional electron microscopes....Pages 255-256
Can the discontinuity in the polarity of the oxide layers at the interface SrTiO 3 -LaAlO 3 be resolved by using Electron Holography with Cs-corrected TEM?....Pages 257-258
Energy-filtered DBI/H....Pages 259-260
Strain determination by dark-field electron holography....Pages 261-262
Nonlinear Electron Inline Holography....Pages 263-264
Electron Holography: Performance and performance limits....Pages 265-266
Reconstruction methods for in-line electron holography of nanoparticles....Pages 267-268
Electron holography of soot nanoparticles....Pages 269-270
Holographic tomography of electrostatic potentials in semiconductor devices....Pages 271-272
Electron Holography on the charge modulated structure In 2 O 3 (ZnO) m in comparison with DFT-calculations....Pages 273-274
Correction of the object wave using iteratively reconstructed local object tilt and thickness....Pages 275-276
Extended field of view for medium resolution electron holography at Philips CM 200 Microscope....Pages 277-278
Electron holography of biological and organic objects....Pages 279-280
Magnetic configurations of isolated and assemblies of iron 30 nm nanocubes studied by electron holography....Pages 281-282
Electron holography study of ferroelectric solid solutions....Pages 283-284
Digital holographic interference microscopy of phase microscopic objects investigation....Pages 285-286
Reconstruction of 3D (Ge,Si) islands by 2D phase mapping....Pages 287-288
Quantitative electron tomography of biological structures using elastic and inelastic scattering....Pages 289-290
Discrete tomography in materials science: less is more?....Pages 291-292
Towards atomic-scale bright-field electron tomography for the study of fullerene-like nanostructures....Pages 293-294
DART explained: how to carry out a discrete tomography reconstruction....Pages 295-296
Optical depth sectioning of metallic nanoparticles in the aberration-corrected scanning transmission electron microscope....Pages 297-298
3D-Geometrical and chemical quantification of Au@SiO x nano-composites in HAADF-STEM imaging mode....Pages 299-300
Electron tomography of mesostructured cellular foam silica....Pages 301-302
A Study of Stacked Si Nanowire Devices by Electron Tomography....Pages 303-304
Simulation of the electron radiation damage in an amorphous Ge sample....Pages 305-306
Observation of Three-dimensional Elemental Distribution by using EF-TEM Tomography....Pages 307-308
HAADF-TEM Tomography of the precipitation state in an Al-Zn-Mg alloy....Pages 309-310
STEM electron tomography of gold nanostructures....Pages 311-312
Three-dimensional imaging of semiconductor nanostructures by compositional-sensitive diffraction contrast electron tomography studies....Pages 313-314
A full tilt range goniometer inside a TEM goniometer....Pages 315-316
Four-dimensional STEM-EELS Tomography....Pages 317-318
Embedment-free section electron microscopy (EM): a highly potential advantage in application to EM tomography....Pages 319-320
Quantification and Segmentation of Electron Tomography Data- Exemplified at ErSi 2 Nanocrystals in SiC....Pages 321-322
3-D TEM observation of xenon nano-precipitates in aluminium crystals....Pages 323-324
Dark-field TEM tomography of ordered domain morphology in a Ni 4 Mo alloy....Pages 325-326
Optimum optical condition of Tomography for thick samples....Pages 327-328
3-dimensional nanoparticle analysis using electron tomography....Pages 329-330
Electron Tomography of ZnO Nanocones with Secondary Signals in TEM....Pages 331-332
Quantification of Nanoparticle Tomograms....Pages 333-334
Tomographic imaging ultra-thick specimens with nanometer resolution....Pages 335-336
Three-dimensional imaging at the mesoscopic scale using STEM-in-SEM....Pages 337-338
Three-dimensional potential mapping of nanostructures with electron-holographic tomography....Pages 339-340
Design of high-speed tomography with the 3MV ultrahigh voltage electron microscope....Pages 341-342
The point spread function assessment of MeV electron imaging quality for thick specimens....Pages 343-344
Relevance of the minimum projection number to specimen structures for high-quality electron tomography....Pages 345-346
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy....Pages 347-348
EMCD with nm Resolution and Below: Experiments, Proposals, and a Paradox....Pages 349-350
Combining electronic and optical spectroscopy at the nanometer scale in a STEM....Pages 351-352
Deconvolution of core loss electron energy loss spectra....Pages 353-354
Obtaining the loss function from angle resolved electron energy loss spectra....Pages 355-356
Revisiting the determination of carbon sp 2 /sp 3 ratios via analysis of the EELS carbon K-edge....Pages 357-358
Orbital and spin sum rules for electron energy loss magnetic chiral dichroism: Application to metals and oxides....Pages 359-360
Probing bright and dark surface plasmon modes in individual and coupled Au nanoparticles using a fast electron beam....Pages 361-362
Dual energy range EELS spectrum imaging using a fast beam switch....Pages 363-364
Determination of local composition of Li-Si alloys by Electron Energy-Loss Spectroscopy....Pages 365-366
Elemental and bond mapping of complex nanostructures by MLS analysis of EELS spectrum-imaging data....Pages 367-368
EELS analysis of plasmon resonance in the UV-vis energy range of metal alloy nanoparticles....Pages 369-370
Anisotropic effects in ELNES of the O-K edge in rutile: a case of trichroism....Pages 371-372
Dissimilar cation migration in (001) and (110) La 2/3 Ca 1/3 MnO 3 thin films....Pages 373-374
Energy-loss near edge structures of Cr 2 O 3 , CrO 2 and YCrO 4 phases....Pages 375-376
Distortion corrections of ESI data cubes for magnetic studies....Pages 377-378
Optimisation of the Positions and the Width of the Energy Windows for the Recording of EFTEM Elemental Maps....Pages 379-380
Band gap mapping using monochromated electrons....Pages 381-382
StripeSTEM, a new method for the isochronous acquisition of HAADF images and monolayer resolved EELS....Pages 383-384
Comparing Transmission Electron Microscopy (TEM) and Tomographic Atom Probe (TAP) through Measurements of Thin Multilayers....Pages 385-386
Development of a Process for Cleaning a TEM Column by Chemical Etching of Oxygen Radicals....Pages 387-388
Low loss EELS study of gold nanoparticles using a monochromated TEM....Pages 389-390
Analytical RPA response of Carbon and BN single-walled nanotubes: Application to EELS and wave loss spectra....Pages 391-392
Improvement of energy resolution of VEELS spectra with deconvolution method for electronic and optical properties analysis on ferroelectric oxides in nano-scale....Pages 393-394
Low Loss Electron Energy Spectroscopy on LiFePO 4 for Li ion Battery Applications....Pages 395-396
Atomic-resolution studies of complex oxide materials using in-situ scanning transmission electron microscopy....Pages 397-398
Low-loss EELS measurements on an oxide multilayer system using monochrome electrons....Pages 399-400
White noise subtraction for calculating the two-particle-structure factor from inelastic diffractograms....Pages 401-402
Local Analysis of BaTiO 3 /SrTiO 3 interfaces by STEM-EELS....Pages 403-404
Experimental conditions and data evaluation for quantitative EMCD measurements in the TEM....Pages 405-406
Investigation of the valency distribution in Cu 1.2 Mn 1.8 O 4 using quantitative EELS near-edge structures analysis....Pages 407-408
EELS mapping of surface plasmons in star-shaped gold nanoparticles: morphological behaviour of optical properties from star to sphere....Pages 409-410
Fast local determination of phases in Li x FePO 4 ....Pages 411-412
EELS/EFTEM in life science: proof of the presence of H 2 O 2 in human skin by Ce deposition in melanosomes....Pages 413-414
Phase separation study of annealed SiOx films through energy filtered scanning transmission electron microscope....Pages 415-416
Phase Identification of Aluminium Oxide Phases by Analysis of the Electron Energy-loss Near Edge Structure....Pages 417-418
Valence sensitivity of Fe-L 2,3 white-line ratios extracted from EELS....Pages 419-420
Calculation of inelastic scattering events within second order QED — Implications of fully relativistic scattering....Pages 421-422
Role of asymmetries for EMCD sum rules....Pages 423-424
Smart acquisition EELS....Pages 425-426
EELS fine structure tomography using spectrum imaging....Pages 427-428
Shift in electron energy loss compared for different nickel silicides in a Pt alloyed thin film....Pages 429-430
Distribution of Fe and In dopants in ZnO: A combined EELS/EDS analysis....Pages 431-432
Changes in the Soot Microstructure during Combustion studied by SEM, TEM, Raman and EELS....Pages 433-434
EELS and EFTEM-investigations of aluminum alloy 6016 concerning the elements Al, Si and Mg....Pages 435-436
EELS modelling using a pseudopotential DFT code....Pages 437-438
The EELS spectrum database....Pages 439-440
STEM-EELS analysis of interface magnetic moments in Fe(100)/Co(bcc) superlattices....Pages 441-442
EMCD at high spatial resolution: comparison of STEM with EELS profiling....Pages 443-444
Elemental, Chemical and Physical State Mapping in Three-Dimensions using EELS-SI Tomography....Pages 445-446
Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM....Pages 447-448
Acquisition of the EELS data cube by tomographic spectroscopic imaging....Pages 449-450
A low electron fluence EELS study of Fe-coordination within ferrihydrite and phosphorous doped ferrihydrite nanoparticles....Pages 451-452
Optimal aperture sizes and positions for EMCD experiments....Pages 453-454
Chemical analysis of nickel silicides with high spatial resolution by combined EDS and EELS (ELNES)....Pages 455-456
Retrieving dielectric function by VEELS....Pages 457-458
Some Recent Materials Applications of In Situ High Resolution Electron Microscopy....Pages 459-460
Melting and solidification of alloys embedded in a matrix at nanoscale....Pages 461-462
Advances in transmission electron microscopy: in situ nanoindentation and in situ straining experiments....Pages 463-464
Observing Nanosecond Phenomena at the Nanoscale with the Dynamic Transmission Electron Microscope....Pages 465-466
TEM characterization of nanostructures formed from SiGeO films: effect of electron beam irradiation....Pages 467-468
In situ Lorentz microscopy in an alternating current magnetic field....Pages 469-470
In-situ transmission electron microscopy investigation of TiO islands nucleating on SrTiO 3 (100) and (110) surfaces at high temperature....Pages 471-472
Probing integration strength of colloidal spheres self-assembled from TiO 2 nanocrystals by in-situ TEM indentation....Pages 473-474
Installation and operation of an in situ electron microscopy facility....Pages 475-476
Bringing chemical reactions to life: environmental transmission electron microscopy (E-TEM)....Pages 477-478
Dynamic in situ experiments in a 1Å double aberration corrected environment....Pages 479-480
A very high temperature (2000°C) stage for atomic resolution in situ ETEM....Pages 481-482
Environmental High Resolution Electron Microscopy With a Closed Ecell: Application to Catalysts....Pages 483-484
Pulsed-mode photon and electron microscopy surveyed....Pages 485-486
In-situ Observation of Nano-particulate Gold Catalysts during Reaction by Closed-type Environmental-cell Transmission Electron Microscope....Pages 487-488
 In situ transmission electron microscopy on leadzirconate-titanate under electrical field....Pages 489-490
Elongation of Atomic-size Wires: Atomistic Aspects and Quantum Conductance Studies....Pages 491-492
Atomic-size Silver Nanotube....Pages 493-494
In-situ TEM mechanical testing of a Si MEMS nanobridge....Pages 495-496
In-situ TEM nanoindentation and deformation of Si-nanoparticle clusters....Pages 497-498
Electron Holography of in-situ ferroelectric polarisation switching....Pages 499-500
Development of fast CCD Cameras for in-situ Electron Microscopy....Pages 501-502
 In situ characterization of the mechanical properties of nanoparticles and nanoscale structures....Pages 503-504
In-situ engineering of nanostructures with near atomic precision and property measurements....Pages 505-506
In-situ TEM investigation of the contrast of nanocrystals embedded in an amorphous matrix....Pages 507-508
In situ HRTEM — Image corrected and monochromated Titan equipped with environmental cell....Pages 509-510
The surface dynamics of the transient oxidation stages of Cu and Cu binary alloys....Pages 511-512
In-situ TEM for altering nanostructures and recording the changes at an atomic resolution....Pages 513-514
Aberration correction in SEM: Relaunching an old project....Pages 515-516
Changes and reversals of contrasts in SEM....Pages 517-518
Surface potential and SE detection in the SEM....Pages 519-520
On the Spatial Resolution and Nanoscale Features Visibility in Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy....Pages 521-522
Scanning electron microscopy techniques for cross-sectional analyses of thin-film solar cells....Pages 523-524
Maximising EBSD acquisition speed and indexing rate....Pages 525-526
Helium ion microscope: advanced contrast mechanisms for imaging and analysis of nanomaterials....Pages 527-528
Hygroscopic properties of individual aerosol particles from aluminum smelter potrooms determined by environmental scanning electron microscopy....Pages 529-530
Analysis of individual aerosol particles by automated scanning electron microscopy....Pages 531-532
A new quantitative height standard for the routine calibration of a 4-quadrant-large-angles-BSE-detector....Pages 533-534
SEM-EDS for effective surface science and as a next generation defect review tool for nanoparticle analysis?....Pages 535-536
Detection of Signal Electrons by Segmental Ionization Detector....Pages 537-538
Low-voltage Scanning Transmission Electron Microscopy of InGaAs nanowires....Pages 539-540
Secondary Electrons Characterization of Hydrogenated Dilute Nitrides....Pages 541-542
Mapping of the local density of states with very slow electrons in SEM....Pages 543-544
Thickness and composition measurement of thin TEM samples with EPMA and the thin film analysis software STRATAGem....Pages 545-546
Automatic acquisition of large amounts of 3D data at the ultrastructural level, using serial block face scanning electron microscopy....Pages 547-548
MCSEM- a modular Monte Carlo simulation program for various applications in SEM metrology and SEM photogrammetry....Pages 549-550
Wien filter electron optical characteristics determining using shadow projection method....Pages 551-552
Strain related Contrast mechanisms in crystalline materials imaged with AsB detection....Pages 553-554
Low Loss BSE imaging with the EsB Detection system on the Gemini Ultra FE-SEM....Pages 555-556
Accurate calculations of thermionic electron gun properties....Pages 557-558
Scintillation SE Detector for Variable Pressure Scanning Electron Microscope....Pages 559-560
The stability of retained austenite in supermartensitic stainless steel (SMSS) examined by means of SEM/EBSD....Pages 561-562
In-situ EBSD studies of hydrogen induced stress cracking (HISC) in pipelines of super-duplex stainless steel....Pages 563-564
E-beam hardening SEM glue for fixation of small objects in the SEM....Pages 565-566
Development of the charging reduction system by electron beam irradiation for scanning electron microscopes....Pages 567-568
Aberrations of the cathode lens combined with a focusing magnetic/immersion-magnetic lens....Pages 569-570
Identification possibilities of micro/nanoparticles and nanocomposites in forensic practice....Pages 571-572
Mass thickness determination of thin specimens using high-resolution scanning electron microscopy....Pages 573-574
Benefits of Low Vacuum SEM for EBSD Applications....Pages 575-576
In-situ combination of SEMPA, STM, and FIB for magnetic imaging and nanoscale structuring....Pages 577-578
Characterisation of the subgrain structure of the aluminium alloy AA6082 after homogenization and hot forming by EBSD....Pages 579-580
An improved detection system for low energy Scanning Transmission Electron Microscopy....Pages 581-582
Thickness determination of thin samples by transmission measurements in a scanning electron microscope....Pages 583-584
Role of the high-angle BSE in SEM imaging....Pages 585-586
Experimental and simulated signal amplification in variable pressure SEM....Pages 587-588
Study of highly-aggressive samples using the variable pressure SEM....Pages 589-590
Characterization of the focusing properties of polycapillary X-ray lenses in the scanning electron microscope....Pages 591-592
Numerical Simulation of Signal Transfer in Scintillator-Photomultiplier Detector....Pages 593-594
 In-situ Electrical Measurements on Nanostructures in a Scanning Electron Microscope....Pages 595-596
3D Sculptures From SEM Images....Pages 597-598
Influence of tilt of sample on axial beam properties....Pages 599-600
Experimental determination of the total scattering cross section of water vapour and of the effective beam gas path length in a low vacuum scanning electron microscope.....Pages 601-602
Response function of the semiconductor detector of backscattered electrons in SEM....Pages 603-604
Main principles of microtomography using backscattered electrons....Pages 605-606
Considerations of some charging effects on dielectrics by electron beam irradiation....Pages 607-608
The reduction of pileup effects in spectra collected with silicon drift detectors....Pages 609-610
High-temperature oxidation of steel in the ESEM with subsequent scale characterisation by Raman microscopy....Pages 611-612
Method to determine image sharpness and resolution in Scanning Electron Microscopy images....Pages 613-614
Instrumentation of an electron microscope for lithography and analysis of devices over a wide dimensional range....Pages 615-616
Ultra-low energy, high-resolution scanning electron microscopy....Pages 617-618
Non-destructive 3D imaging of the objects internal microstructure by microCT attachment for SEM....Pages 619-620
A novel use of rf-GD sputtering for sample surface preparation for SEM: its impact on surface analysis....Pages 621-622
Development of an ultra-fast EBSD detector system....Pages 623-624
Future prospects on EBSD speeds using a 40 nA FESEM....Pages 625-626
High pressure imaging in the environmental scanning electron microscope (ESEM)....Pages 627-628
Cathodoluminescence spectrum-imaging in the scanning electron microscope using automated stage control....Pages 629-630
Low voltage, high resolution SEM imaging for mesoporous materials....Pages 631-632
New developments in state of the art silicon drift detectors (SDD) and multiple element SDD....Pages 633-634
SEM in forensic science....Pages 635-636
Secondary electron imaging due to interface trapped charges for a buried SiO 2 microstructure....Pages 637-638
HRSEM Secondary Electron Doping Contrast: Theory based on Band Bending and Electron Affinity Measurements....Pages 639-640
3D EBSD-based orientation microscopy and 3D materials simulation tools: an ideal combination to study microstructure formation processes....Pages 641-642
Capturing Sub-Nanosecond Quenching in DualBeam FIB/SEM Serial Sectioning....Pages 643-644
Deformation mechanisms in 1D nanostructures revealed by in situ tensile testing in an SEM/FIB....Pages 645-646
Focused Ion Beam Tomography of Insulating Biological and Geological Materials....Pages 647-648
Redeposition and differential sputtering of La in TEM samples of LaAlO 3 / SrTiO 3 multilayers prepared by FIB....Pages 649-650
Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam milling....Pages 651-652
TEM sample preparation on photoresist....Pages 653-654
Advanced FIB preparation of semiconductor specimens for examination by off-axis electron holography....Pages 655-656
Comparison of ion- and electron-beam-induced Pt nanodeposits: composition, volume per dose, microstructure, and in-situ resistance....Pages 657-658
In-line FIB TEM sample preparation induced effects on advanced fully depleted silicon on insulator transistors....Pages 659-660
The development of cryo-FIBSEM techniques for the sectioning and TEM analysis of the cell-biomaterial interface....Pages 661-662
Three-slit interference experiments with electrons....Pages 663-664
Contrast in ion induced secondary electron images....Pages 665-666
Quantitative in situ thickness determination of FIB TEM lamella by using STEM in a SEM....Pages 667-668
Analysis of ion diffusion in multilayer materials by depth profiling in a Crossbeam FIB-SIMS microscope....Pages 669-670
Growth of In 2 O 3 islands on Y-stabilised ZrO 2 : a study by FIB and HRTEM....Pages 671-672
Carbon nanotubes grown in contact holes for nano electronic applications: how to prepare TEM samples by FIB?....Pages 673-674
Advances in 3-dimensional material characterisation using simultaneous EDS and EBSD analysis in a combined FIB-SEM microscope....Pages 675-676
Investigation of the effects of the TEM specimen preparation method on the analysis of the dielectric gate stack in GaAs based MOSFET devices....Pages 677-678
Manipulation and contacting of individual carbon nanotubes inside a FIB workstation....Pages 679-680
High volume TEM-sample preparation using a wafer saving in-line preparation tool....Pages 681-682
The influence of beam defocus on volume growth rates for electron beam induced platinum deposition....Pages 683-684
Reducing of ion beam induced surface damaging using “low voltage” focused ion beam technique for transmission electron microscopy sample preparation....Pages 685-686
DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization....Pages 687-688
Time-resolved photoemission electron microscopy....Pages 689-690
Quantitative 3D imaging of cells at 50 nm resolution using soft x-ray tomography....Pages 691-692
STXM-NEXAFS of individual titanate-based nanoribbon....Pages 693-694
The fine structure of bioreactor liver tissue seen through the eyes of X-ray micro-computed tomography....Pages 695-696
Comparing the Si(Li)-detector and the silicon drift detector (SDD) using EDX in SEM....Pages 697-698
Enhancing contrast of Al traces on Si substrates using low-voltage SEM-hosted XRM....Pages 699-700
An optical demonstration of ptychographical imaging of a single defect in a model crystal....Pages 701-702
HRTEM and STXM, a combined study of an individual focused-ion-beam patterned CNT....Pages 703-704
Compact micro-CT/micro-XRF system for non-destructive 3D analysis of internal chemical composition....Pages 705-706
NanoCT: Visualising of Internal 3D-Structures with Submicrometer Resolution....Pages 707-708
Dynamics of nanostructures on surfaces revealed by high-resolution, fast-scanning STM....Pages 709-710
Spin mapping on the atomic scale....Pages 711-712
Researching the structure of the surface of undoped ZnO thin films by means of Atomic Force Microscopy....Pages 713-714
Improving the structural characterization of supported on glass gold nanoparticles using Atomic Force Microscopy on vacuum conditions....Pages 715-716
CO and O 2 chemisorption on Pd 70 Au 30 (110) : evolution of the surface studied by in situ STM and complementary surface analysis techniques at elevated pressures....Pages 717-718
Height measurements on soft samples: applied force, molecules deformation and phase shift....Pages 719-720
Effect of temperature on phase transition of cardiolipin liquid-crystalline aggregates studied by AFM....Pages 721-722
Investigating the influence of dynamic scattering on ptychographical iterative techniques....Pages 723-724
Determination of the lateral Resolution of a Cantilever based Solid Immersion Lens Near Field Microscope....Pages 725-726
LT-STM manipulation and spectroscopy of single copper and cobalt atoms....Pages 727-728
3D atomic-scale chemical analysis of engineering alloys....Pages 729-730
New Applications for Atom-Probe Tomography in Metals, Semiconductors and Ceramics....Pages 731-732
Pulsed laser atom probe tomography analysis of advanced semiconductor nanostructures....Pages 733-734
Low Energy Electron Microscopy: A 10 Year Outlook....Pages 735-736
Imaging of Surface Plasmon Waves in Nonlinear Photoemission Microscopy....Pages 737-738
High resolution surface analysis of metallic and biological specimens by NanoSIMS....Pages 739-740
Elemental distribution profiles across Cu(In,Ga)Se 2 solar-cell absorbers acquired by various techniques....Pages 741-742
High resolution Kelvin force microscopy....Pages 743-744
High resolution in interferometric microscopy....Pages 745-746
Effects of annealing on the microstructural evolution of copper films using texture analysis....Pages 747-748
Characterisation of Ga-distribution on a silicon wafer after inline FIB-preparation using inline ToFSIMS....Pages 749-750
First results in thin film analysis based on a new EDS software to determine composition and/or thickness of thin layers on substrates....Pages 751-752
Calibration of RHEED patterns for the appraisal of titania surface crystallography....Pages 753-754
Surface orientation dependent termination and work-function of in situ annealed strontium titanate....Pages 755-756
Structure determination of zeolites by electron crystallography....Pages 757-758
3D electron diffraction of protein crystals: data collection, cell determination and indexing....Pages 759-760
Self-assembly of cholesterol-based nonionic surfactants in water. Unusual micellar structure and transitions....Pages 761-762
Quantitative study of anode microstructure related to SOFC stack degradation....Pages 763-764
New considerations for exit wavefunction restoration under aberration corrected conditions....Pages 765-766
High quality electron diffraction data by precession....Pages 767-768
Optimal noise filters for high-resolution electron microscopy of non-ideal crystals....Pages 769-770
Noise considerations in the application of the transport of intensity equation for phase recovery....Pages 771-772
elmiX — An Electron Microscopy Software Collection for Data Analysis and Education....Pages 773-774
Speed considerations when performing particle analysis and chemical classification by SEM/EDS....Pages 775-776
Morphological characterization of particles with very broad size distributions using program MDIST....Pages 777-778
Multiple protein structures in one shot: maximum-likelihood image classification in 3D-EM....Pages 779-780
Compensation and evaluation of errors of 3D reconstructions from confocal microscopic images....Pages 781-782
High content image-based cytometry as a tool for nuclear fingerprinting....Pages 783-784
Measurement of surface area of biological structures, based on 3D microscopic image data....Pages 785-786
The imaging function for tilted samples: simulation, image analysis and correction strategies....Pages 787-788
4D-Microscopy....Pages 789-790
Strategies for high content imaging screening and analysis of primary neurons....Pages 791-792
Modelling and analysis of clustering and colocalization patterns in ultrastructural immunogold labelling of cell compartments based on 3-D image data....Pages 793-794
Modern Methods of TEM Specimen Preparation in Material Science....Pages 795-796
Ultramicrotomy in biology and materials science: an overview....Pages 797-798
Preparation of Biological Samples for Electron Microscopy....Pages 799-800
Web sample preparation guide for transmission electron microscopy (TEM)....Pages 801-802
Novel carbon nanosheets as support for ultrahigh resolution structural analysis of nanoparticles....Pages 803-804
A new automated plunger for cryopreparation of proteins in defined - even oxygen free - atmospheres....Pages 805-806
A novel method for precipitates preparation using extraction replicas combined with focused ion beam techniques....Pages 807-808
An appraisal of FIBSEM and ultramicrotomy for the TEM analysis of the cell-biomaterial interface....Pages 809-810
Observation of the structure of aqueous polymers with cryo-SEM....Pages 811-812
Lipid nanotube encapsulating method in low voltage scanning transmission electron microscopy....Pages 813-814
Microscopy observation of food biopolymers and related sample preparation methods....Pages 815-816
Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method....Pages 817-818
Serial-section Polishing Tomography....Pages 819-820
Visualization of detergent resistant membrane rafts in human colorectal cancer cells with correlative confocal and transmission electron microscopy....Pages 821-822
Contribution of low tension ion-milling to heterostructural semiconductors preparation....Pages 823-824
Metallographic characterization of MgH 2 -Mg system....Pages 825-826
LSM tomography of 2-cell mouse embryo....Pages 827-828
Microwave-assisted sample preparation for life science....Pages 829-830
Comparison TEM specimen preparation of perovskite thin films by conventional Ar ion milling and tripod polishing....Pages 831-832
 In-situ temperature measurements on TEM-specimen during ion-milling....Pages 833-834
Back Matter....Pages 835-862