Backscattering Spectrometry

Content: 
Front Matter, Page iii
Copyright, Page iv
Dedication, Page v
Preface, Pages xi-xiii
Acknowledgments, Page xv
Chapter 1 - Introduction, Pages 1-20
Chapter 2 - Basic Physical Concepts, Pages 21-53
Chapter 3 - Concepts of Backscattering Spectrometry, Pages 54-88
Chapter 4 - Backscattering Spectrometry of Thin Films, Pages 89-122
Chapter 5 - Examples of Backscattering Analysis, Pages 123-152
Chapter 6 - Instrumentation and Experimental Techniques, Pages 153-184
Chapter 7 - Influence of Beam Parameters, Pages 185-222
Chapter 8 - Use of Channeling Techniques, Pages 223-275
Chapter 9 - Energy-Loss Measurements, Pages 276-287
Chapter 10 - Bibliography on Applications of Backscattering Spectrometry, Pages 288-319
Appendix A - Transformation of the Rutherford Formula from Center of Mass to Laboratory Frame of Reference, Pages 320-322
Appendix B - Influence of Energy Straggling on a Thin-Film Spectrum, Pages 323-327
Appendix C - The True Position of the Edges of a Narrow Rectangular Signal, Pages 328-331
Appendix D - List of Energy-Loss Compilations, Pages 332-333
Appendix E - Rough Targets, Pages 334-338
Appendix F - Numerical Tables, Pages 339-348,350-373
Index of Definitions and Notation, Pages 375-377
Index, Pages 378-384