Amplitude Modulation Atomic Force Microscopy

Contents......Page 8
Preface......Page 12
Annotation List......Page 14
1.1Historical Perspective......Page 16
1.2Evolution Periods and Milestones......Page 17
1.3Tapping Mode or Amplitude Modulation Force Microscopy?......Page 20
1.4Other Dynamic AFM Methods......Page 21
2.2Amplitude Modulation AFM......Page 24
2.3Elements of an Amplitude Modulation AFM......Page 25
2.4Cantilever–Tip System......Page 30
2.5Calibration Protocols......Page 34
2.6Common Experimental Curves......Page 36
2.7Displacements and Distances......Page 38
3.2Van der Waals Forces......Page 40
3.3Contact Mechanics Forces......Page 42
3.4Capillary Force......Page 45
3.5Forces in Liquid......Page 47
3.6Electrostatic Forces......Page 50
3.7Nonconservative Forces......Page 51
3.8Net Tip–Surface Force......Page 53
4.1Introduction......Page 56
4.2Equation of Motion......Page 57
4.3The Point-Mass Model: Elemental Aspects......Page 58
4.4The Point-Mass Model: Analytical Approximations......Page 63
4.5Peak and Average Forces......Page 67
4.6The Point-Mass Model: Numerical Solutions......Page 69
Appendix AThe Runge–Kutta Algorithm......Page 71
5.2Q-Control......Page 74
5.3Nonlinear Dynamics......Page 77
5.4Continuous Cantilever Beam Model......Page 79
5.5Equivalence between Point-Mass and Continuous Models......Page 82
5.6Systems Theory Description......Page 84
5.7Force Reconstruction Methods: Force versus Distance......Page 85
5.8Time-Resolved Force......Page 88
6.2Qualitative Aspects of the Cantilever Dynamics in Liquid......Page 92
6.3Interaction Forces in Liquid......Page 95
6.4Some Experimental and Conceptual Considerations......Page 97
6.5Theoretical Descriptions of Dynamic AFM in Liquid......Page 99
7.2Phase Imaging Atomic Force Microscopy......Page 106
7.3Theory of Phase Imaging AFM......Page 110
7.4Energy Dissipation Measurements at the Nanoscale......Page 113
8.2Spatial Resolution......Page 118
8.3Image Distortion and Surface Reconstruction......Page 123
8.4Force-Induced Surface Deformations......Page 124
8.5Atomic, Molecular, and Subnanometer Lateral Resolution......Page 126
8.7Conditions for High-Resolution Imaging......Page 128
8.8Image Artifacts......Page 129
9.2Normal Modes and Harmonics......Page 132
9.3Bimodal AFM......Page 137
9.4Mode-Synthesizing Atomic Force Microscopy......Page 140
9.5Torsional Harmonic AFM......Page 141
9.6Band Excitation......Page 142
10.2Scattering Near-Field Optical Microscopy......Page 144
10.3Topography and Recognition Imaging......Page 147
10.4Nanofabrication by AFM......Page 149
References......Page 154
index......Page 190