Advances in X-Ray Analysis: Volume 37

Content: 
Front Matter....Pages i-xxi
Impact of the Personal Computer on X-ray Analysis Historical Perspective 1960–1990....Pages 1-6
Software for XRD....Pages 7-12
Software for XRF....Pages 13-20
The Use of PCs for AB Initio Structure Determination from Powder Diffraction Data....Pages 21-25
Applications of Profile Analysis for Micro-Crystalline Properties from Total Pattern Fitting....Pages 27-35
Applications of Whole-Powder-Pattern Fitting Technique in Materials Characterization....Pages 37-47
Application of ODF to the Rietveld Profile Refinement of Polycrystalline Solid....Pages 49-57
Diffrac-At Search: Search/Match Using Full Traces as Input....Pages 59-66
The Effect of Various Pattern Aberrations on Figures of Merit Used with Whole Pattern Recognition Techniques....Pages 67-77
An Experimental Evaluation of Computational Methods for Determining Lattice Parameters Using Bragg-Brentano Powder Diffractometry....Pages 79-85
Enhancing XRPD Pattern Quality With Line-Profile-Fitting in Multiphase Systems....Pages 87-93
Powder Diffraction Pattern Simulation and Analysis....Pages 95-99
New Developments in PC-Based Powder Data Retrieval Programs....Pages 101-107
New Methods for the Accurate Comparison of Lattice Parameters....Pages 109-115
Experimental Comparison of Widely Differing Lattice Parameters....Pages 117-121
Fourier Transformation of X-ray Rocking Curves from Interferometer Structures....Pages 123-128
High Speed Characterization of Pseudomorphic HEMT Structures Using a very Low Noise Scintillation Detector....Pages 129-133
Combined Asymmetric Reflection and Transmission Method for High Accuracy X-ray Crystallographic Measurements....Pages 135-144
Residual Stress in Thin Films of Aluminum/Hafnium....Pages 145-151
The Effects of Using Long Soller Slits as “Parallel Beam Optics” for GIXRD on Diffraction Data....Pages 153-156
Characterization of TiN Film by XRD and XRF....Pages 157-165
The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination from Reflectivity Data....Pages 167-173
Stress-Depth Profiles in Magnetron Sputtered Mo Films Using Grazing Incidence X-ray Diffraction (Gixd)....Pages 175-182
Development of a Numerical Procedure for Determining the Depth Profiles of X-ray Diffraction Data....Pages 183-188
Analysis of Multi-Layer Thin Films by XRF....Pages 189-196
Resolving Common Element Problem by Using Different Lines in Fundamental Parameters Method Multilayer Thin Film Analysis....Pages 197-203
Small Area X-ray Fluorescence Analysis of Multilayer Thin Metal Films....Pages 205-212
High Accuracy Analysis of BPSG Thin Films on Silicon Wafers by X-ray Wafer Analyzer....Pages 213-218
Complicated Average Stress-Fields and Attempts at Their Evaluation with X-ray Diffraction Methods....Pages 219-227
Evaluation of ?33 from Diffraction Experiments Performed with Synchrotron Radiation in the ?- and ?- Goniometries....Pages 229-234
Methods for Depth Profiling Complete Stress Tensors Using Neutron Diffraction....Pages 235-244
Counting Statistical Errors in Principal Stresses and Directions Determined by Diffraction....Pages 245-251
New Advantages in Soft X-ray Stress Measurement and Triaxial Analysis of Nonuniform Stress States....Pages 253-264
Residual Stress Analysis of Different Microstructures in Alumina Microelectronic Substrates....Pages 265-278
X-Ray Stress Measurement of Alloy Steels....Pages 279-289
X-ray Fractographic Study on Fatigue Fracture Surface of Ductile Cast Iron....Pages 291-298
Application of X-ray Examination to Fracture Surface of TiAl Intermetallic Compound....Pages 299-304
Size/Strain Broadening Analysis of SRM 676 Candidate Materials....Pages 305-315
X-ray Profile Analysis of 12% Chromium Stainless Steel....Pages 317-325
Microcrystalline Properties of Quartz by Means of XRPD Measures....Pages 327-334
X-ray Diffraction Orientation Studies Using Two-Dimensional Detectors....Pages 335-342
Julios: A Position-Sensitive Neutron Detector and Its Application to White Beam Time-of-flight Diffraction....Pages 343-349
The Development of a Time-Resolved X-ray Measurement System Using Imaging Plate....Pages 351-358
Thickness Gauging of Organic Films on Large Plastic Body Parts with an XRF Probe Based on a Room-Temperature Mercuric Iodide Detector....Pages 359-366
High Energy Resolution X-ray Spectrometer for High Count Rate XRF Applications....Pages 367-373
Ultra-High Vacuum Grazing Incidence Small Angle X-ray Scattering Camera for in Situ Surface Analysis....Pages 375-384
High-Pressure Powder Diffraction Using an Image-Plate Area Detector....Pages 385-393
Application of a Flatbed Transparency Scanner as an XRD Spanning Densitometer....Pages 395-404
Measurements of the Thermal Expansion of Materials with High Melting Points by X-ray Diffraction....Pages 405-411
The Effective Thermal Expansion of Nickel and Nickel Oxide During High-Temperature Oxidation....Pages 413-418
Low Temperature Attachment for X-ray Powder Diffractometry....Pages 419-432
The Construction of Quantitative Inverse Pole Figures Using the Available ODF Data....Pages 433-439
Texture Measurement of Sintered Alumina Using the March-Dollase Function....Pages 441-447
In Situ X-ray Diffraction of an Arc Weld Showing the Phase Transformations of Ti and Fe as A Function of Position in the Weld Performed at a Synchrotron....Pages 449-456
Measurement of Retained Austenite in Stainless Steel Using Imaging Plate....Pages 457-463
Analysis of the Average Poly-Cyclic Aromatic Unit in a Meta-Anthracite Coal Using Conventional X-ray Powder Diffraction and Intensity Separation Methods....Pages 465-471
Capillary Optics for X-ray Analysis....Pages 473-478
A New X-ray Lens and Its Applications....Pages 479-482
Transcendental Cylindrical Reflectors in Glancing X-ray Optics....Pages 483-490
Toroidally Shaped HOPG Crystals as Strongly Focusing Bragg Reflectors of Characteristic X-ray Tube Radiation for EDXRF Analysis....Pages 491-497
The Use of Multilayer Structures in the Energy Dispersive X-ray Fluorescence Analysis of Low Z Elements....Pages 499-506
Characteristics of New Pyrolitic Graphite Crystal for X - ray Diffraction and Fluorescence Analysis....Pages 507-514
Optics for X-ray Microfluorescence to Be Used at the European Synchrotron Radiation Facility....Pages 515-522
TXRF Semiconductor Applications....Pages 523-533
Total Reflection XRF of Light Elements Using Various Excitation Sources....Pages 535-544
Total Reflection X-ray Fluorescence Spectroscopy: Analysis of GaAs and InGaAs....Pages 545-552
Optimization of TRXF Spectrometer with Bent Cut-Off Filter....Pages 553-563
TXRF High Sensitivity X-ray Analyzer with Multi-Layer Monochromator....Pages 565-575
Fluorescence Yield Xanes and EXAFS Experiments: Application To Highly Dilute and Surface Samples....Pages 577-583
XRF with Tunable Monochromatic Excitation and Variation of the Incidence Angle....Pages 585-593
Sensitivity Improvement and Stabilization for Ultra Light Element Analysis by X-ray Spectrometry....Pages 595-598
Why the Fundamental Algorithm is So Fundamental....Pages 599-605
Mathematical Modeling of XRF Matrix Correction Algorithms with an Electronic Spreadsheet....Pages 607-617
New Empirical Regression Type Algorithm and Software for High Precision XRF Spectrometry....Pages 619-627
Matrix Correction with Barkla Excitation Using the Coherent/Incoherent Method....Pages 629-637
Analysis of Boron and Other Light Elements in Glasses by the Fundamental Parameter Method....Pages 639-646
Investigation of Geometrical Effects in X-ray Microfluorescence Analysis of Geological Samples....Pages 647-656
Evaluating Indirectly the X-ray Tube Spectra on the Basis of the Fundamental Parameter Method in Wavelength-Dispersive X-ray Spectrometry....Pages 657-666
Measurement of Relative X-ray Intensity Ratios for Elements with Z=14 to 92 Using EDXRF Spectrometer....Pages 667-675
Study of Combustion Originated Ash Particles....Pages 677-683
High Productivity Geochemical XRF Analysis....Pages 685-687
Computerized X-ray Data Periodic Table....Pages 689-696
On-Line Analysis of Molten Metals Using a Wavelength Dispersive X-ray Spectrometer....Pages 697-709
Quantitative XRF Analysis of Coal After Successive Leachings....Pages 711-716
A New Method of Graphic Representation of Sample Analysed by XRF....Pages 717-724
Back Matter....Pages 725-728
....Pages 729-733