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ویرایش: نویسندگان: Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.) سری: ISBN (شابک) : 9781461365327, 9781461534600 ناشر: Springer US سال نشر: 1992 تعداد صفحات: 607 زبان: English فرمت فایل : PDF (درصورت درخواست کاربر به PDF، EPUB یا AZW3 تبدیل می شود) حجم فایل: 38 مگابایت
در صورت تبدیل فایل کتاب Advances in X-Ray Analysis: Volume 35B به فرمت های PDF، EPUB، AZW3، MOBI و یا DJVU می توانید به پشتیبان اطلاع دهید تا فایل مورد نظر را تبدیل نمایند.
توجه داشته باشید کتاب پیشرفت در تجزیه و تحلیل اشعه ایکس: جلد 35B نسخه زبان اصلی می باشد و کتاب ترجمه شده به فارسی نمی باشد. وبسایت اینترنشنال لایبرری ارائه دهنده کتاب های زبان اصلی می باشد و هیچ گونه کتاب ترجمه شده یا نوشته شده به فارسی را ارائه نمی دهد.
برازش کل الگو، تجزیه و تحلیل ریتولد، و الگوهای پراش محاسبه شده. تجزیه و تحلیل فاز کمی با پراش اشعه ایکس (XRD). لایه نازک و خصوصیات سطح توسط XRD. عیوب شبکه و توپوگرافی اشعه ایکس. تجزیه و تحلیل بافت توسط XRD. ابزار دقیق XRD، تکنیک ها و مواد مرجع. تعیین تنش با روشهای پراش. فیتینگ پروفایل XRD، اندازه کریستالیت و تعیین کرنش. کاربردهای XRD: محدودیتهای تشخیص، ابررساناها، مواد آلی، مواد معدنی. روش های ریاضی در طیف سنجی اشعه ایکس (XRS). لایه نازک و مشخصه سطح توسط XRS و XPS. بازتاب کل XRS. تکنیک ها و ابزار دقیق XRS برنامه های کاربردی XRS تصویربرداری و توموگرافی اشعه ایکس161 مقاله. فهرست مطالب.
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
Content:
Front Matter....Pages i-iv
Mathematical Correction Procedures in XRF - The Long and the Short....Pages 693-701
New Developments in FP-Based Software for Both Bulk and Thin-Film XRF Analysis....Pages 703-709
Software Packages for the Automatic Assessment of XRF Data for Qualitative and Semi-Quantitative Analysis....Pages 711-713
A Fast Algorithm for Fundamental Parameter Calculations....Pages 715-720
An Algorithm for the Description of White and Characteristic Tube Spectra (11 ? Z ? 83, 10keV ? Eo ? 50keV)....Pages 721-726
NCSXRF: A General Geometry Monte Carlo Simulation Code for EDXRF Analysis....Pages 727-736
Unification of “Standard Background” Technique Using Scattered Radiation in X-Ray Fluorescence Analysis (XRF)....Pages 737-742
Decomposition Spectrometric Data of Energy Dispersive X-Ray Fluorescence Analysis (EDXRF)....Pages 743-748
X-Ray Fluorescence Analysis of Nonhomogeneous Materials by ?µ-Correction Method....Pages 749-754
Theoretical Calculation of Background in X-Ray Spectrometry for the Determination of Some Heavy Trace Elements....Pages 755-756
Systematic Computation of Scattering Corrections with the Code Shape....Pages 757-766
Recent Developments in Surface and Thin Film Analysis Using Low - Energy Electron Induced X - Ray Spectrometry (LEEIXS)....Pages 767-781
Depth Profiling by Means of X-Ray Fluorescence Analysis....Pages 783-794
Grazing Incidence X-Ray Fluorescence Analysis Using Synchrotron Radiation....Pages 795-806
Grazing Incidence X-Ray Spectroscopy for Thin Layer Analysis....Pages 807-812
Layer Thickness Determination of Thin Films by Grazing Incidence X-Ray Experiments Using Interference Effect....Pages 813-818
X-Ray Studies of Chromium Nitride (CrxNy) Thin Films Deposited by Reactive Magnetron Sputtering....Pages 819-827
Multi-Layer XRF Calculations....Pages 829-834
Multiple Scattering Contributions of Thin Films in Reflection Geometry....Pages 835-843
The Use of the Conventional Isolated Atom Model for the Theoretical Calculation of the Dependence of L?/L? Intensity Ratio on the Sample Exit Angle for Unoxidized and Oxidized Transition Metal Alloy Thin Films....Pages 845-850
X-Ray Photoelectron and Fluorescence Spectra of Several Zirconium Oxide Compounds....Pages 851-856
Depth Profiling by Means of X-Ray Photoelectron Spectrometry....Pages 857-867
The Use of X-Ray Photoelectron Spectroscopy in Materials Science....Pages 869-882
Surface and Thin Film Analysis of Metals and Semiconductors Using X-Ray Photoelectron Spectroscopy....Pages 883-897
Trace Element Analysis Using Total-Reflection X-Ray Fluorescence Spectrometry....Pages 899-923
TXRF with Various Excitation Sources....Pages 925-931
Instrumentation for Total Reflection Fluorescent X-Ray Spectrometry....Pages 933-940
Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry....Pages 941-946
Light Element Analysis with TXRF....Pages 947-952
Application of TXRF in Environmental Research....Pages 953-958
Determination of Heavy Metals in Environmental Water by Total Reflection X-Ray Fluorescence Method Using Optimized Roentgen Optics Cut-Off Filter....Pages 959-963
Uranium Concentration Measurement in Water Samples with TXRF....Pages 965-967
Application of Total Reflection X-Ray Fluorescence Spectrometry to Drug Analysis....Pages 969-974
An Integrated X-Ray Tube - Polarizer EDXRF-Spectrometer in Cartesian Geometry....Pages 975-980
Variability of Crystal Performance in X-Ray Fluorescence Spectrometers....Pages 981-985
An X-Ray Spectrometer for Pixel Analysis of Art Objects....Pages 987-993
Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line....Pages 995-1000
The Comparison of Three Excitation Modes in the Energy Dispersive X-Ray Fluorescence Analysis....Pages 1001-1007
Geometric Considerations in EDXRF to Increase Fluorescence Intensities and Reduce Background....Pages 1009-1017
X-Ray Microbeam Spectroscopy With the Use of Capillary Optics....Pages 1019-1025
Synchrotron Radiation X-Ray Fluorescence Analysis with a Crystal Spectrometer....Pages 1027-1033
A New User Oriented Intelligent XRF Spectrometer System....Pages 1035-1046
A High Resolution Portable XRF HgI2 Spectrometer for Field Screening of Hazardous Metal Wastes....Pages 1047-1053
Experimental XRF Calculation Method with Correction for a Polydisperse Material Particle Size....Pages 1055-1061
Fabrication and Selected Applications of a Nist X-Ray Microfluorescence Spectrometer....Pages 1063-1067
Problems in the Use of Multilayers for Soft X-Ray Spectroscopy and Analysis: A Comparison of Theoretically and Experimentally Determined Refraction Effects....Pages 1069-1078
A Method for In-Situ Calibration of Semiconductor Detectors....Pages 1079-1081
The Use of Bragg Reflection on Single Crystals for the Production of Polarized Excitation Radiation in the EDXRF....Pages 1083-1089
X-Spectrum Determination Applied to Flash Radiography....Pages 1091-1095
Analytical X-Ray Analysis Techniques: A Panorama of Some of the Applications in Latin America....Pages 1097-1099
Backscatter/Fundamental-Parameters Analysis of Unweighed Samples using Multi-Target, Multi-Crystal Regions of Interest from WDXRF and EDXRF....Pages 1101-1106
L X-Ray Line Shape of Copper(II) Compounds and Their Covalency....Pages 1107-1114
A Xanes Study of Square Copper(II) Complexes....Pages 1115-1120
Comparison of Elemental Sensitivities Induced by Radioisotope and Secondary Target Excitation for Simultaneous Multielement X-Ray Analysis....Pages 1121-1126
The Study of Valuable Medals Using X-Ray Analysis....Pages 1127-1132
X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis....Pages 1133-1138
XRF Spectrometric Determination of YBCO System, BPSCCO System, and TBCCO System High Tc Oxide Superconductors....Pages 1139-1145
Measurements of Low Concentration Components in Iron Ores Using Fusion Method....Pages 1147-1155
A New Instrument for the Energy Dispersive X-Ray Fluorescence Analysis of Objects of Art and Archaeology....Pages 1157-1163
Provenance of Kanjera Fossils by X-Ray Fluorescence and Ion Microprobe Analyses....Pages 1165-1173
Fast and Simple Routine Determination of Bromine by XRF in Wet Blood Serum Microsamples. Evaluation of Errors....Pages 1175-1182
X-Ray Microprobe Studies of Hungarian Background and Urban Aerosols....Pages 1183-1188
Stastitical Comparison of Analytical Results Obtained by Pressed Powder and Borate Fusion XRF Spectrometry for Process Control Samples of a Lead Smelter....Pages 1189-1196
The Local Structure of Chromium(III) in the Mixed Glycerol Aqueous Solution....Pages 1197-1203
Using a Priori Information in Energy-Dispersive X-Ray Fluorescence Analysis of Complex Samples....Pages 1205-1209
In-Process Coating Layer Analysis of Galvannealed Steel Sheets with Monochromatic Incident X-Rays....Pages 1211-1218
Imaging the Three-Dimensional Microstructure of Materials....Pages 1219-1226
X-Ray Optics for Scanning Fluorescence Microscopy and other Applications....Pages 1227-1233
Evaluation of a Combined Transmission and Scattering Approach to Composition Imaging of Industrial Samples....Pages 1235-1241
A New Nondestructive Quantitative Composition Depth Profiling Technique Based on X-Ray Excited Electron Emission....Pages 1243-1246
Software Development for X-Ray Microbeam Spectroscopy....Pages 1247-1254
Large-Area X-Ray Micro-Fluorescence Imaging of Heterogeneous Materials....Pages 1255-1264
Comparison of Synchrotron X-Ray Microanalysis With Electron and Proton Microscopy for Individual Particle Analysis....Pages 1265-1273
A Novel Scanning X-Ray Diffracto-Microscope/X-Ray Powder Diffractometer Using Converged X-Ray Beam....Pages 1275-1283
Development of a High Spatial Resolution X-Ray Fluorescence Element Mapping Spectrometer and Its Application to Quantitative Analysis of Biological Systems....Pages 1285-1287
Scanning X-Ray Analytical Microscope Using X-Ray Guide Tube....Pages 1289-1293
Gamma Ray and X-Ray Imaging Studies of the Location and Shape of the Melt-Solid Interface during Bridgman Growth of Germanium and Lead-Tin-Telluride....Pages 1295-1300
Measurement of Macrosegregations of Steels by X-Ray Microfluorescence....Pages 1301-1306
Application of SR-XRF Imaging and Micro-XANES to Meteorites, Archaeological Objects and Animal Tissues....Pages 1307-1315
Back Matter....Pages 1317-1333