Advances in X-Ray Analysis: Volume 32

Content: 
Front Matter....Pages iii-xxv
Synchrotron Radiation X-Ray Fluorescence Analysis....Pages 1-7
X-Ray Diffraction Using Synchrotron Radiation — A Catalysis Perspective....Pages 9-20
On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements....Pages 21-30
Process Control Applications of the Peltier Cooled Si(Li) Detector Based EDXRF Spectrometer....Pages 31-37
Application of Fundamental Parameter Software to On-Line XRF Analysis....Pages 39-44
On-Stream XRF Measuring System for Ore Slurry Analysis....Pages 45-47
Applications of On-Line XRF and XRD Analysis Techniques To Industrial Process Control....Pages 49-57
On-Site Tests of a new XRD/XRF on-Line Process Analyzer....Pages 59-68
Concepts of Influence Coefficients in XRF Analysis and Calibration....Pages 69-75
Painless XRF Analysis Using New Generation Computer Programs....Pages 77-82
Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications....Pages 83-87
What Can Data Analysis do for X-Ray Microfluorescence Analysis?....Pages 89-95
The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method....Pages 97-103
How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF....Pages 105-114
Applications of a Laboratory X-Ray Microprobe to Materials Analysis....Pages 115-120
Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System....Pages 121-129
Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry....Pages 131-139
Micro X-Ray Fluorescence Analysis with Synchrotron Radiation....Pages 141-147
X-Ray Microprobe Studies Using Multilayer Focussing Optics....Pages 149-153
Resolution Enhancement for Cu K? Emission of Y-Ba-Cu-O Compounds....Pages 155-165
Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts....Pages 167-176
High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts....Pages 177-183
Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer....Pages 185-190
The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission....Pages 191-195
Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry....Pages 197-204
Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis....Pages 205-210
Sample Treatment for TXRF — Requirements and Prospects....Pages 211-220
Sample Preparation Optimization for EDXRF Analysis of Portland Cement....Pages 221-226
The Viability of XRF Determination of Gold in Mineral Reconnaissance....Pages 227-231
An Improved Fusion Technique for Major-Element Rock Analysis by XRF....Pages 233-238
Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer....Pages 239-250
Low Level Iodine Detection by TXRF Spectrometry....Pages 251-253
The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals....Pages 255-259
Characterization of Permalloy Thin Films Via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry....Pages 261-268
X-Ray Diffraction Analysis of High Tc Superconducting Thin Films....Pages 269-278
Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method....Pages 279-284
Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction....Pages 285-292
Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method....Pages 293-301
X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins....Pages 303-310
X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry....Pages 311-321
Density Measurement of Thin Sputtered Carbon Films....Pages 323-330
Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique....Pages 331-339
Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel....Pages 341-353
X-Ray Diffractometric Determination of Lattice Misfit Between ? and ?’ Phases in Ni-Base Superalloys....Pages 355-364
Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics....Pages 365-375
Elastic Constants of Alloys Measured with Neutron Diffraction....Pages 377-388
Stress Measurements with a Two-Dimensional Real-Time System....Pages 389-395
Application of a New Solid State X-Ray Camera to Stress Measurement....Pages 397-406
Advantages of the Vector Method to Study the Texture of Well Textured Thin Layers....Pages 407-413
Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis....Pages 415-421
X-Ray Diffraction Studies on Shock Modified Y Ba2Cu3O7 Superconductors....Pages 423-428
The Characterization of a Solid Sorbent with Crystallite Size and Strain Data from X-Ray Diffraction Line Broadening....Pages 429-436
X-Ray Measurement of Grinding Residual Stress in Alumina Ceramics....Pages 437-441
Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel....Pages 443-449
Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method....Pages 451-458
Residual Stresses in Al2O3/SiC (Whisker) Composites Containing Interfacial Carbon Films....Pages 459-469
Parallel Beam and Focusing X-Ray Powder Diffractometry....Pages 471-479
Chemical Constraints in Quantitative X-Ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks....Pages 481-488
Using X-Ray Powder Diffraction to Determine the Structure of VPI-5 — A Molecular Sieve with the Largest Known Pores....Pages 489-496
Optimizing the calculation of standardless quantitative analysis....Pages 497-505
Shadow: A System for X-Ray Powder Diffraction Pattern Analysis....Pages 507-514
Specific Data Handling Techniques and New Enhancements in a Search/Match Program....Pages 515-522
Use of the Crystal Data File on CD-ROM....Pages 523-530
A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification....Pages 531-538
On the Selection of the Value for the Experimental Wavelength in Powder Diffraction Measurements....Pages 539-544
Results of the JCPDS-ICDD Intensity Round Robin....Pages 545-550
On the Preparation of Good Quality X-Ray Powder Patterns....Pages 551-556
Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard....Pages 557-560
Mechanically-Induced Phase Transformations in Plutonium Alloys....Pages 561-567
The Determination of ?-Cristobalite in Airborne Dust by X-Ray Diffraction — Theory and Practice....Pages 569-576
Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals....Pages 577-584
Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-Ray Powder Diffractometry....Pages 585-592
X-Ray Diffraction Studies of Solid Solutions of Pentaglycerine-Neopentylglycol....Pages 593-600
Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector....Pages 601-607
Vacuum Free-Fall Method for Preparation of Randomly Oriented XRD Samples....Pages 609-616
Applications of Dual-Energy X-Ray Computed Tomography to Structural Ceramics....Pages 617-623
Microtomography Detector Design: It’s Not Just Resolution....Pages 625-628
Required Corrections for Analysis of Industrial Samples with Medical CT Scanners....Pages 629-640
Back Matter....Pages 641-650
LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs....Pages 651-657
....Pages 667-681